Keysight Technologies, Inc.

Yasuhiro Miyake

Hiroshi Nada

Nobuaki Iwaki

Masaki Sato

A measurement apparatus includes external terminals configured for connection to a device-under-test (DUT), the external terminals including first and second force terminals and first and second sense terminals. The measurement apparatus further includes a controller and a feedback loop configured in a current feedback mode to sense a current flowing from the first force terminal to the second force terminal, and in a voltage feedback mode to sense a voltage across the first and second sense terminals. The measurement apparatus further includes a measurement path configured to measure a least one of a voltage and current across a pair of the external terminals and to supply the measured at least one of the voltage and current to the controller.

Source measure apparatus including feedback path and measurement path

A current measurement device is provided for use with a measurement target having a conductive path. The current measurement device includes a non-contact current sensor to be positioned adjacent the conductive path of the measurement target. A calibration current superimposing unit, including a first electrode and a second electrode to be positioned in contact with the conductive path of the measurement target, is configured to output a calibration current to flow through the conductive path between the first electrode and the second electrode. A controller, coupled to the non-contact current sensor and the calibration current superimposing unit, is configured to control the output of the calibration current from the calibration current superimposing unit, and is configured to sample a signal from the non-contact current sensor positioned adjacent the conductive path of the measurement target.

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Hachioji Tokyo, Japan

Yasuhiro Miyake