Mitsubishi Denki Kabushiki Kaisha

Yasuhiro Mabuchi

Teruhiko Funakura

Hisayoshi Hanai

Toshiaki Koyama

Akira Imamura

A semiconductor integrated circuit device has a first LT fuse group for storing replacement information used in a memory array; a second LT fuse group for storing confirmation information to confirm whether the first LT fuse group has accurately stored the replacement information; and an input/output port for outputting information PI actually stored in the first LT fuse group and information CI actually stored in the second LT fuse group to an external memory tester. The first and second LT fuse groups are fabricated according to the same conditions, and the laser input to the respective group is set to be under the same conditions.

Semiconductor integrated circuit device having link element

A low-cost semiconductor tester which saves memory space for storing a test pattern by means of producing a high-speed clock while preparing a test pattern at a low-speed test cycle and which has a test-pattern storage circuit of small storage capacity, as well as a semiconductor test method using the semiconductor tester. The semiconductor tester includes a reference-signal-generation circuit for producing a test cycle to be taken as a reference-signal, a waveform formation circuit for producing the geometry of an output waveform on the basis of the test cycle, and a waveform output circuit which sets the voltage of the geometry of the output waveform and applies the voltage to a semiconductor element to be measured. A ring oscillation circuit is provided in the waveform formation circuit and has a variable delay circuit. The ring oscillation circuit converts the output waveform, which waveform is produced at a predetermined timing, into a high-speed clock waveform.

Growing community of inventors

Hyogo, Japan

Yasuhiro Mabuchi