Tokyo Electron Limited

Yasuhiko Nishinakayama

Hiroaki Saeki

Shigeru Ishizawa

Hiroyuki Takahashi

Tetsu Osawa

Keiji Osada

Gaku Ikeda

Takashi Kawano

Noise reduction processing for detecting the circumferential edge of a wafer W placed on a rotary stage with a light-transmitting sensor, obtaining detection values provided by the light-transmitting sensor as substrate edge shape data, detecting sudden abnormal data in the substrate edge shape data, eliminating the detected sudden abnormal data and interpolating the substrate edge shape data with estimated data generated based upon surrounding data in place of the abnormal data, notch mark judgment processing for detecting a notch mark candidate in the substrate edge shape data having undergone the noise reduction processing and making a decision as to whether or not the sets of data corresponding to the notch mark candidate area satisfies a predetermined judgment condition, and substrate positioning processing for positioning the substrate based upon a notch mark that satisfies the predetermined judgment conditions are executed.

Substrate positioning device, substrate positioning method and program

The invention is a method for positioning a conveying mechanism having a holding portion for semiconductor wafers. Respective provisional position coordinates of an orienting teaching standard position and a container teaching standard positions are inputted into a controlling unit in advance. A wafer to be conveyed precisely positioned with respect to and held by the holding portion is conveyed and placed on the rotating orienting device according a control based on the provisional coordinates of the orienting teaching standard position. A posture detector then detects the eccentric volume and eccentric direction of the wafer. Appropriate position coordinates are made by amending the provisional coordinates. Then, a wafer to be conveyed precisely positioned with respect to the container teaching standard position is conveyed and placed on the rotating orienting device according a control based on the provisional coordinates of the orienting teaching standard position. A posture detector then detects the eccentric volume and eccentric direction of the wafer. Appropriate position coordinates are made by amending the provisional coordinates.

Carrier system positioning method

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Nirasaki, Japan

Yasuhiko Nishinakayama