Hitachi, Ltd.

Hitachi-high-technologies Corporation

National Research Institute of Police Science

Hitachi High-tech Corporation

Nof Corporation

President of National Research of Police Science

Yasuaki Takada

Minoru Sakairi

Hisashi Nagano

Takayuki Nabeshima

Hideaki Koizumi

Yuichiro Hashimoto

Atsumu Hirabayashi

Izumi Waki

Yukiko Hirabayashi

Hideo Kashima

Masuyuki Sugiyama

Masakazu Sugaya

Koichi Terada

Hideki Hasegawa

Masao Suga

Yasuo Seto

Masuyoshi Yamada

Tadao Mimura

Kaoru Umemura

Hiroyuki Satake

Yasutaka Suzuki

Hidehiro Okada

Tatsuo Nojiri

Isaac Ohsawa

Yasushi Terui

Takashi Baba

Shun Kumano

Toshihiko Ohta

Masami Sakamoto

Shigeru Honjo

Yoshihiro Nishikawa

Masumi Fukano

Kenji Kusumoto

Teruo Itoi

Kazumitsu Iura

Yasuhiro Sano

Shigeharu Yamashiro

Yoichi Ose

Hiroshi Sekiguchi

Kiyomi Yoshinari

Isamu Takekoshi

Masaki Ishikawa

Tomoyuki Tobita

Yasunori Doi

Masamichi Tsukada

Masaru Tomioka

Seiji Kamimura

Akihiko Okumura

Shinji Yoshioka

Akimasa Osaka

Toshihiro Ishizuka

Seiji Tanaka

Hiroki Mizuno

Masaki Matsumoto

Keiko Nakashige

Mitsuhiro Noda

Katsumi Nagumo

Shigenori Morishima

Hirofumi Tsutsumi

Youichi Ose

Tsukasa Shishika

Hiromi Satou

Hisashi Maruko

Akio Torii

Tomoyuki Hisada

Mieko Kataoka

Kouichiro Tsuge

Koushou Aikawa

Masayuki Takizawa

A substance analyzer that includes, to enhance selectivity of substance analysis, the following: a heater that heats a medium for collecting a chemical substance adhering to a surface of an inspection object; a mass spectrometer that performs tandem mass spectrometry of vapor derived from the chemical substance heated and vaporized by the heater from the medium; and a control device that causes the mass spectrometer to perform, based on a temperature of the medium in the heater, tandem mass spectrometry for the chemical substance that is vaporized at the temperature of the medium using the vapor sent from the heater to the mass spectrometer.

Substance analyzer and substance analysis method

An object of the invention is to improve uniformity of a standard sample used for evaluating a gas flow type analysis system. The invention includes weighing a background into a container; adding a sample solution to the background; drying the sample solution; adding a solvent that can dissolve the sample into the container; and drying the solvent added to the container. The invention is also characterized in that the solvent is an organic solvent, in particular, acetone.

Method for preparing standard sample for gas flow type analysis system

In order to save a space for an apparatus for inspecting a substance and reduce a cost thereof, a particle testing apparatus includes a plurality of collection ports for collecting substances to be inspected, centrifuges for concentrating particles collected in the collection ports, the centrifuges being connected to the respective collection ports in pairs, and a common analysis apparatus for acquiring the concentrated particles from the centrifuges and analyzing the particles, the analysis apparatus being connected to the centrifuges.

Substance-testing apparatus, substance-testing system, and substance-testing method

In a conventional fine particle detection device that vaporizes fine particles attached to the object of examination by heating, processing capability decreases as the processing time elapses due to the influence of deposition of fine particles other than the object of examination, dirt/dust, a residue of the fine particles as the object of examination, or residual matter. A fine particle detection device according to the present invention includes: a vaporization device that vaporizes the fine particles trapped by a trap device by vaporization or decomposition; a first flow passageway in which a mixture of a component vaporized by the vaporization device and another component flows; a second flow passageway branching from the first flow passageway in a direction of inertial force acting on the other component; a third flow passageway branching from the first flow passageway in a direction different from the direction of the inertial force; and an analysis device that analyzes a component introduced into the third flow passageway.

Microparticle detection device and security gate

Provided is a technique to identify a sample substance attached to an inspection target easily and precisely, while improving the rate of operation and reducing the number of persons required for inspection. A trace detecting system includes detection means to detect the size (vertical and horizontal dimensions) of an inspection target, and selects an air nozzle capable of spraying air jet at 15 m/s or more to the surface of the inspection target for air jet spraying.

Attached matter testing device and testing method

An explosive detection apparatus capable of maintaining high availability even in an environment containing a large amount of foreign substances is achieved. The explosive detection apparatus includes means for sequentially replacing a plurality of collection thermal vaporization filtersfor collecting, heating, vaporizing particles, which have been prepared in advance. The explosive detection apparatus also includes a preheating unitfor preheating an unused filter, and sealing is performed by a seal portion between the plurality of filters.

Particle analyzing device

Provided is an analyzer for a substance, including: a first particle holding unit having a tubular shape; a first intake pipe for sucking a gas from an upper side of the first particle holding unit to cause a cyclonic phenomenon inside the first particle holding unit; a first supply pipe for supplying a sample containing particles, the first supply pipe being connected to a side surface of the first particle holding unit; a first flow control unit for controlling a flow rate of a gas flowing into the first particle holding unit to hold the rotationally moving particles inside the first particle holding unit for a predetermined time period and then cause the particles to settle, the first flow control unit being connected to a lower part of the first particle holding unit; a first collection heating unit for collecting and heating the settled particles; and an analysis unit for analyzing a substance vaporized from the particles through the heating by the first collection heating unit, the analysis unit being connected to the first collection heating unit through a pipe.

Analyzer for substance

Sample fine particles attached to an inspection object are identified simply and with high accuracy, and an increase in operation rate and a decrease in device size are achieved. The inspection object is transported into a sampling chamber defined by a pair of side walls and an upper wall enclosing a part of a transport route of a transport unit. The inspection object is sprayed with compressed gas from an air nozzle, the peeled sample fine particles are aspirated into a collector, and the sample fine particles are separated from the aspirated gas for analysis. The air nozzle is disposed on one of the side walls defining the sampling chamber. The collector is disposed under the other side wall as a container independent from the sampling chamber.

Attached matter inspection device

An object is to measure both cations and anions with high duty cycle. In a mass spectrometer comprising an ion source (), an ion guide part (), and an ion trap (), while ions are being mass-selectively ejected from the ion trap, ions having a polarity reverse to that of the ions trapped in the ion trap are introduced into the ion guide part.

Mass spectrometer and mass spectrometry method

A technology for collecting a granular substance adhering to a baggage with high rate without touching the substance and inspecting whether a dangerous or specific sample material is adhered to the baggage. A method for simplifying or automating such an inspection is also provided. An adhering matter inspection equipment () is characterized in that the equipment comprises a collecting section () for collecting a sample material peeled off from an inspection object () whereupon the sample material is adhered by blowing compression gas through a capturing filter (), and an inspecting section () for analyzing the sample material captured by the capturing filter (), and further characterized in that the inspection equipment comprises a section () for delivering a baggage to the inspecting section (), and a carrying section () for carrying the capturing filter () from the capturing section () to the inspecting section ().

Adhering matter inspection equipment and method for inspecting adhering matter

A method of quickly detecting a handmade explosive in a bottle with a low erroneous alarm frequency is provided. A sample gas generated from a bottle placed on a bottle placement space is sucked-in, and ions of the sample gas are generated by an ion source and subjected to mass analysis. The presence/absence of a mass spectrum derived from the handmade explosive is determined from an obtained mass spectrum, and the result thereof is displayed on a monitor, thereby quickly detecting the handmade explosive in the bottle or the handmade explosive adhering to the surface of the bottle at a low erroneous alarm frequency.

Dangerous substance detection system

Mass transit terrorism is prevented to construct a safe society. Individual explosive sensing devices are connected by a network to establish a security system. Information collected in the security center is compared with a database to determine a risk. When the risk exceeds a predetermined level upon determination of the risk, measures may be taken such that an alarm is activated and instructions for making a security guard carry out the parcel inspection of the person causing the risk are transmitted to the security guard. According to the present invention, the security can be enhanced while the social life is still convenient even when the explosive sensing device having a high throughput is employed at places such as mass transit where many people gather. Therefore, the terror risk on the mass transit can be reduced to contribute to construction of the safe society.

Security system, security center apparatus, and security management method

Adhering matter inspection equipment and method for inspecting adhering method

There has been a problem that both detection sensitivity and throughput cannot be improved simultaneously by a conventional MS/MS analysis method. A mass analyzer having an ion trap for ejecting ions in a specific mass range, a collisional dissociation part for causing ions ejected from the ion trap to be dissociated, a mass analyzing part for performing a mass analysis of ions ejected from the collisional dissociation part, and a control part including a list in which measurement conditions for each ion are stored selectively resonance-ejects ions introduced into and accumulated in the ion trap based on masses. A scanning operation is a repetition of an operation of ejecting specific precursor ions in a direction of the collisional dissociation part and an operation of ejecting nothing, and each ion can be measured under optimal measurement conditions by controlling an output voltage of each part with reference to list information, realizing a mass analyzer that can perform an MS/MS measurement with high throughput and high sensitivity.

Mass analyzer and mass analyzing method

A mass spectrometer includes a linear multipole electrode, an auxiliary electrode that applies a DC potential on the center axis of the linear multipole electrode, and a DC power supply that supplies a DC power to the auxiliary electrode. The DC potential slope formed on the center axis of the multipole electrode is changed according to the measuring condition. The ejection time of ions can be adjusted optimally by adjusting the potential slope so as to satisfy the measuring condition. If the ejection time of ions is shortened, confusion of different ion information items that might otherwise occur on a spectrum can be avoided. If the ejection time of ions is lengthened, detection limit exceeding can be avoided and ions can be measured efficiently, thereby highly efficient ion measurements are always assured.

Mass spectrometer

Growing community of inventors

Kiyose, Japan

Yasuaki Takada