Growing community of inventors

Kiryat Tivon, Israel

Yaron Zimmerman

Average Co-Inventor Count = 4.29

ph-index = 1

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 7

Yaron ZimmermanBoris Greenberg (2 patents)Yaron ZimmermanFares Marjieh (2 patents)Yaron ZimmermanVladimir Levinski (1 patent)Yaron ZimmermanJoel L Seligson (1 patent)Yaron ZimmermanMordekhai Velger (1 patent)Yaron ZimmermanSemion Kofman (1 patent)Yaron ZimmermanIzhak Bucher (1 patent)Yaron ZimmermanAbraham Rotnemer (1 patent)Yaron ZimmermanArkady Bronfman (1 patent)Yaron ZimmermanShoam Shwartz (1 patent)Yaron ZimmermanIgor Tikhonenkov (1 patent)Yaron ZimmermanRoyi Levav (1 patent)Yaron ZimmermanHanna Friedman (1 patent)Yaron ZimmermanAlex Novikov (1 patent)Yaron ZimmermanShlomi Efrati (1 patent)Yaron ZimmermanYaron Zimmerman (4 patents)Boris GreenbergBoris Greenberg (12 patents)Fares MarjiehFares Marjieh (2 patents)Vladimir LevinskiVladimir Levinski (96 patents)Joel L SeligsonJoel L Seligson (25 patents)Mordekhai VelgerMordekhai Velger (8 patents)Semion KofmanSemion Kofman (8 patents)Izhak BucherIzhak Bucher (6 patents)Abraham RotnemerAbraham Rotnemer (2 patents)Arkady BronfmanArkady Bronfman (2 patents)Shoam ShwartzShoam Shwartz (2 patents)Igor TikhonenkovIgor Tikhonenkov (2 patents)Royi LevavRoyi Levav (1 patent)Hanna FriedmanHanna Friedman (1 patent)Alex NovikovAlex Novikov (1 patent)Shlomi EfratiShlomi Efrati (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Kla Tencor Corporation (1 from 1,787 patents)

2. Technion Research & Development Foundation Ltd (1 from 964 patents)

3. Eyeway Vision Ltd. (1 from 10 patents)

4. Voxelsensors Srl (1 from 5 patents)


4 patents:

1. 12449654 - Eye tracking systems and methods

2. 12292565 - MEMS based light deflecting device and method

3. 8054522 - Oscillating mirror having a plurality of eigenmodes

4. 7724375 - Method and apparatus for increasing metrology or inspection tool throughput

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as of
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