Growing community of inventors

Kiryat Tivon, Israel

Yaron Zimmerman

Average Co-Inventor Count = 4.29

ph-index = 1

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 7

Yaron ZimmermanBoris Greenberg (2 patents)Yaron ZimmermanFares Marjieh (2 patents)Yaron ZimmermanVladimir Levinski (1 patent)Yaron ZimmermanJoel L Seligson (1 patent)Yaron ZimmermanSemion Kofman (1 patent)Yaron ZimmermanMordekhai Velger (1 patent)Yaron ZimmermanIzhak Bucher (1 patent)Yaron ZimmermanAbraham Rotnemer (1 patent)Yaron ZimmermanArkady Bronfman (1 patent)Yaron ZimmermanIgor Tikhonenkov (1 patent)Yaron ZimmermanRoyi Levav (1 patent)Yaron ZimmermanShoam Shwartz (1 patent)Yaron ZimmermanHanna Friedman (1 patent)Yaron ZimmermanAlex Novikov (1 patent)Yaron ZimmermanShlomi Efrati (1 patent)Yaron ZimmermanYaron Zimmerman (4 patents)Boris GreenbergBoris Greenberg (12 patents)Fares MarjiehFares Marjieh (2 patents)Vladimir LevinskiVladimir Levinski (94 patents)Joel L SeligsonJoel L Seligson (25 patents)Semion KofmanSemion Kofman (8 patents)Mordekhai VelgerMordekhai Velger (8 patents)Izhak BucherIzhak Bucher (6 patents)Abraham RotnemerAbraham Rotnemer (2 patents)Arkady BronfmanArkady Bronfman (2 patents)Igor TikhonenkovIgor Tikhonenkov (2 patents)Royi LevavRoyi Levav (1 patent)Shoam ShwartzShoam Shwartz (1 patent)Hanna FriedmanHanna Friedman (1 patent)Alex NovikovAlex Novikov (1 patent)Shlomi EfratiShlomi Efrati (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Kla Tencor Corporation (1 from 1,787 patents)

2. Technion Research & Development Foundation Limited (1 from 944 patents)

3. Eyeway Vision Ltd. (1 from 10 patents)

4. Voxelsensors Srl (1 from 5 patents)


4 patents:

1. 12449654 - Eye tracking systems and methods

2. 12292565 - MEMS based light deflecting device and method

3. 8054522 - Oscillating mirror having a plurality of eigenmodes

4. 7724375 - Method and apparatus for increasing metrology or inspection tool throughput

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as of
12/8/2025
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