Lecroy Corporation

Yaron Habot

Peter James Pupalaikis

Martin Miller

Joseph M Schachner

Michael Schnecker

An apparatus and method for processing a data signal is provided. An acquisition unit of a test instrument acquires a data signal for a predetermined time. The data signal is stored in a memory of the test instrument and a clock recovery unit recovers a clock signal from the stored data signal. The stored data signal is sliced by a processor into a plurality of data segments of a predetermined length in accordance with the recovered clock signal.

Method and apparatus for analyzing serial data streams

An apparatus for processing a data signal is provided. The apparatus comprises an acquisition unit of a test instrument for acquiring a data signal for a predetermined time, a memory of the test instrument for storing the data signal, and a clock recovery unit for recovering a clock signal from the stored data signal. A processor slices the stored data signal into a plurality of data segments of a predetermined length in accordance with the recovered clock signal.

A method of processing a data signal is provided. The method comprises the steps of acquiring a data signal by an acquisition unit of a test instrument for a predetermined time and storing the data signal in a memory of the test instrument. A clock signal is recovered from the stored data signal, and the stored data signal is sliced into a plurality of data segments of a predetermined length in accordance with the recovered clock signal.

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Teaneck, NJ, United States of America

Yaron Habot