National University of Defense Technology

Yaqing Chi

Bin Liang

Xiaoyu Zhang

Deng Luo

Jianjun Chen

Hengzhou Yuan

The present disclosure discloses a Single-Event Transient (SET) pulse measuring circuit capable of eliminating impact thereof, and an integrated circuit chip. The SET pulse measuring circuit capable of eliminating impact thereof includes four parts: a SET pulse test chain, a latch circuit, a flip-flop test circuit, a latching self-trigger circuit. The integrated circuit chip is provided with a test chain module and two sets of SET pulse measuring circuits capable of eliminating impact thereof, and inputs of the two sets of SET pulse measuring circuits capable of eliminating impact thereof are the same and each are connected to an output terminal of the test chain module.

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Changsha, China

Yaqing Chi