Boe Technology Group Co., Ltd.

Ordos Yuansheng Optoelectronics Co., Ltd.

Yaorong Liu

Hongxia Yang

Peng Chen

Tao Yang

Wei Song

Lin Liu

Ling Tong

Guoqing Zhang

Xiaowei Wang

Ke Zhao

Hongwei Gao

Pucha Zhao

Xiaopeng Bai

Yonghong Zhang

Zhihui Jia

Yan Zong

Zenghong Li

Xuan Zhang

Tianyu Xu

Sungho Kim

A test circuitry and a method for testing the same and a test system are provided. The test circuitry includes: a test signal input end, configured to input an initial test signal; a signal output end, configured to output a target test signal; and a signal shaping circuitry coupled to the test signal input end and the signal output end, configured to remove a noise signal from the initial test signal to obtain the target test signal.

Test circuitry and method for testing the same, test system

A set of measurement voltages having different voltage values are subsequently inputted to a measurement voltage input terminal of the pixel driving circuit, a light emitting state of a light emitting device under each measurement voltage is detected, and it is determined whether a storage capacitor in the pixel driving circuit is normal based on the light emitting state of the light emitting device.

Capacitor detection method and pixel driving circuit

A method for manufacturing an OLED panel is provided by embodiments of the present disclosure, including following steps of: manufacturing an OLED motherboard which comprises a plurality of OLED panel areas spaced apart from one another, each comprising a display region and a frit package region which is located on a periphery of the display region and is to encapsulate the display region by a frit; and cutting the OLED motherboard along a cutting line to obtain separated OLED panels; and the cutting line is located within the frit package region and at a predetermined distance inwards from an edge of the periphery of the frit package region.

Method for manufacturing OLED panel

A method and an apparatus are provided for detecting and classifying an active matrix organic light emitting diode panel. The method includes: comparing images to be compared which are collected from the active matrix organic light emitting diode panel with template images in a preset template image library; classifying the active matrix organic light emitting diode panel depending on results of the comparing.

Method and apparatus for detecting and classifying active matrix organic light emitting diode panel

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Beijing, China

Yaorong Liu