Taiwan Semiconductor Manufacturing Comp. Ltd.

Yao-Jen Hsieh

Kai-Ming Liu

Ming-Huei Tsai

A method includes operation below: extracting layout patterns that include interconnection layers between a first terminal and a second terminal coupled to the first terminal, in a layout design of a circuit; comparing a first portion of the layout patterns with a first coding portion that specifies a first layout constraint, in which the first portion of the layout patterns is extracted in a sequence starting from the first terminal or to the first terminal; comparing a second portion of the layout patterns with a second coding portion that specifies a second layout constraint, in which the second portion of the layout patterns is extracted in a sequence from the second terminal or to the second terminal; in response to comparisons, initiating fabrication of at least one element of the circuit according to the layout design.

Layout checking system and method

A method includes operation below. At least one portion of layout patterns coupled between a first terminal and a second terminal of a circuit is extracted from a layout design for the circuit. The at least one portion is compared with at least one coding portion, in which the at least one coding portion specifies layout constraints for either the first terminal or the second terminal of the circuit. When the at least one portion meets the at least one coding portion, fabrication of the circuit is initiated according to the layout design.

A method includes the operation below. Groups, indicating layout patterns of interconnection layers, are assigned to a circuit, to determine layout constraints of the circuit. Layout patterns are extracted from a layout design for the circuit. The layout patterns are compared with the layout constraints. Data, indicating the layout design, for fabrication of the circuit are generated in a condition that the layout patterns meet the layout constraints.

A method of detecting a parasitic transistor detecting is provided. The method includes extracting several diodes from a selected area, selecting at least one diode pair from the diodes in accordance with signals connected to the diodes, and filtering the at least one diode pair in accordance with a threshold distance to determine whether at least one parasitic transistor is obtained.

Method and computer-readable medium for detecting parasitic transistors by utilizing equivalent circuit and threshold distance

A method includes extracting multiple-patterning group assignment information of one or more layout patterns from a layout design. The layout design corresponds to a circuit design, and the one or more layout patterns corresponding to a node of the circuit design. Whether the extracted multiple-patterning group assignment information is consistent with a set of multiple-patterning group assignment constraints of the node is determined by a hardware processor.

Layout checking system for multiple-patterning group assignment constraints

A method for checking the inter-chip connectivity of a three-dimensional (3D) integrated circuit (IC) generally comprises receiving a design file for each of a plurality of chips of the 3D IC and generating a plurality of inter-layer ports to be shared between at least two of the of chips based on the design files for each of the chips. A layout without the share ports for each of the chips based on the design files for each of the chips is generated and a layout versus schematic (LVS) check is conducted for each of the generated layouts by using the identified inter-layer ports.

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Taipei, Taiwan

Yao-Jen Hsieh