Guangdong University of Technology

Yanzhou Zhou

Shengli Xie

Kan Xie

Haochuan Zhang

Provided is an optical interference light source device of a current-temperature controlled semiconductor laser, including a heat dissipation plate, a ring-shaped semiconductor refrigerating sheet, a semiconductor laser, a PCB board, a thermal sensor and a fixed plate. The first circular window copper area of the PCB is in contact with the second circular copper area through a via. A lower end of a housing of the semiconductor laser is connected to the first circular windowed copper area through a thermally conductive silicone grease. The ring-shaped semiconductor refrigerating sheet is connected to the first circular window copper area through a thermally conductive silicone grease connected to the heat dissipation plate. The thermal sensor is configured to detect a temperature of the first circular windowed copper area. The present disclosure has beneficial effects of simple structures, good thermal conductivities, high temperature control precisions, and stable output wavelengths of the laser.

Optical interference light source device of current-temperature controlled semiconductor laser and measurement system including the same

Provided is a device for measuring a lens three-dimensional profile based on laser wavenumber scanning, including: a semiconductor laser for emitting coherent light; a beam splitter for dividing the coherent light into two parts; an optical wedge; a CCD camera for capturing an interference image; a computer for processing image information; a laser controller for adjusting an operating temperature and an operating current of the semiconductor laser; and a bilateral telecentric lens. The coherent light is reflected by the optical wedge and then reaches the bilateral telecentric lens through the beam splitter, to form a first reflected light path. The coherent light is reflected by the measured lens, and then reaches the bilateral telecentric lens through the beam splitter, to form a second reflected light path. The first reflected light path and the second reflected light path form an interference image after passing through the bilateral telecentric lens.

Device and method for measuring lens contour based on laser wave number scanning

The present disclosure discloses a dual-channel optical three-dimensional interference method based on underdetermined blind source separation, which blindly separates out, through interference data collected by a CCD camera, interference signals between surfaces of a slide under test, to solve interference signal parameters, including an interference signal amplitude-frequency and an interference signal phase-frequency. Based on a dual-channel optical three-dimensional Michelson-type interference experiment, estimation of a mixed matrix is obtained by a K-means clustering algorithm, and recovery of a source signal is achieved by a L1 norm shortest path method. It is finally achieved that laser wavenumber scanning can accurately and blindly separate out the interference signals of the four surfaces based on light intensity values collected by the CCD camera, to achieve the blind separation of the interference signals of the four surfaces.

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Guangzhou, China

Yanzhou Zhou