Nuctech Company Limited

Yange Du

Zhiqiang Chen

Yuanjing Li

Xianghao Wu

Jundi Dai

Limin Liu

Xu Fang

Yi Yan

The present application relates to a method of assisting analysis of a radiation image and a system using the same, which belongs to the field of image processing. A method of assisting analysis of a radiation image includes: acquiring a radiation image to be analyzed; acquiring customs declaration information of the radiation image to be analyzed; acquiring a feature-matched historical image from a typical image library according to the radiation image to be analyzed; and/or acquiring a standard image and/or detailed customs declaration information of the standard image according to the customs declaration information of the radiation image to be analyzed. The method of assisting analysis of a radiation image and the system using the same may assist an image inspection person to judge whether or not the current radiation image carries violation items, whether or not a concealing or missing report occurs and so on.

Method of assisting analysis of radiation image and system using the same

A system and method for customs inspection and release are disclosed. In one aspect, a system includes a device layer of devices for inspection and release, at least some of which generate subject detection data. The system also includes an adaptor layer of adaptors corresponding to the devices that receive detection data from its corresponding device and convert it into an event in a formatted message. The system also includes a message service layer including a bus that receives events from the adaptor layer and constructs event messages based on them. The system also includes a processing control layer that receives and processes event messages, generates instructions associated with them, and transmits the instructions to the message service layer, which constructs instruction messages based on the received instructions and transmits them to the adaptor layer. The adaptor layer converts them into device instructions that operate based on them.

Customs inspection and release system and method

Growing community of inventors

Beijing, China

Yange Du