Tsinghua University

Nuctech Company Limited

Yan You

Ziran Zhao

Xuming Ma

Yuanjing Li

Zhiqiang Chen

Jian Wu

Rui Fan

Kai Wang

Yingkang Jin

Zhimin Zheng

Xing Liu

Shixin Zhang

Wenguo Liu

Lingbo Qiao

Huan Xie

Yinglei Wang

Wenguo Lui

Xiaojing Bai

The present disclosure provides an electromagnetic imaging device for an active microwave and millimeter wave security inspection apparatus, including: a two-dimensional multiple-input multiple-output array panel including at least one sub-array, wherein each sub-array includes a plurality of transmitting antennas arranged linearly and a plurality of receiving antennas arranged linearly, the plurality of transmitting antennas arranged linearly being intersected with the plurality of receiving antennas arranged linearly; a signal processing device; a display device; and a ranging radar. In each sub-array, a midpoint of a connection line between each transmitting antenna and a corresponding receiving antenna serves as a virtual equivalent phase center of a pair of the each transmitting antenna and the corresponding receiving antenna, and the plurality of transmitting antennas and the plurality of receiving antennas are arranged to generate an equivalent phase center web. A distance between adjacent transmitting antennas or a distance between adjacent receiving antennas is equal to a wavelength of the electromagnetic wave with the specific frequency, and a distance between adjacent equivalent phase centers in the equivalent phase center web generated ranges from 30% to 70% of the wavelength of the electromagnetic wave with the specific frequency.

Electromagnetic imaging device for active microwave and millimeter wave security inspection apparatus

A security inspection apparatus and a method of controlling the same are described. An example security inspection apparatus includes a bottom plate configured to carry an inspected object and a two-dimensional multi-input multi-output array panel, including at least one two-dimensional multi-input multi-output sub-array. Each two-dimensional multi-input multi-output sub-array includes transmitting antennas and receiving antennas arranged such that equivalent phase centers are arranged in a two-dimensional array. The security inspection apparatus includes a control circuit configured to control the transmitting antennas to transmit a detection signal in a form of an electromagnetic wave to the inspected object in a preset order, and to control the receiving antennas to receive an echo signal from the inspected object. The security inspection apparatus includes a signal processing device configured to reconstruct an image of an inspected object based on an echo signal received and a display device configured to display the reconstructed image.

Security inspection apparatus and method of controlling the same

The application describes a security inspection apparatus and a method of controlling the same. An example security inspection apparatus includes a body fixed in the field and an electromagnetic imaging device installed on the body. The electromagnetic imaging device includes a two-dimensional multi-input multi-output array panel, including at least one two-dimensional multi-input multi-output sub-array and a control circuit. Each two-dimensional multi-input multi-output sub-array includes transmitting antennas and receiving antennas, with the transmitting antennas and the transmitting antennas being arranged such that equivalent phase centers are arranged in a two-dimensional array. The electromagnetic imaging device further includes a signal processing device configured to reconstruct an image of an inspected object based on an echo signal received and a display device configured to display the reconstructed image of the inspected object.

A terahertz security inspection robot is provided, including: a housing including a main housing and a head housing rotatably connected to the main housing; a terahertz wave imaging mechanism including a mirror assembly arranged in the head housing and a detector array arranged in the main housing; and a rotating mechanism configured to cause the head housing and the mirror assembly located in the head housing to rotate with respect to the main housing, so that the mirror assembly of the terahertz wave imaging mechanism is oriented in different directions to respectively perform terahertz scanning and imaging on objects to be inspected in different inspection regions in a security inspection scene.

Terahertz security inspection robot

Growing community of inventors

Beijing, China

Yan You