China Electronic Technology Corporation, 24th Research Institute

No. 24 Research Institute of China Electronics Technology Group Corporation

Chongqing Gigachip Technology Co. Ltd.

Lifan Industry (group) Co., Ltd.

No. 24 Research Institute of China Electronic Technology Corporation

Yan Wang

Tao Liu

Dongbing Fu

Ting Li

Guang-Bing Chen

Yu-Xin Wang

Guangbing Chen

Ruzhang Li

Yuxin Wang

Daiguo Xu

Gang-Yi Hu

Dong-Bing Fu

Jian'an Wang

Yong Zhang

Xu Wang

Jian-An Wang

Jun Luo

Gangyi Hu

Liang Li

Hequan Jiang

Lu Liu

Minming Deng

Ru-Zhang Li

Shengdong Hu

Zheng-Bo Huang

Mingyuan Xu

Lei Zhang

Jianan Wang

Zhengping Zhang

Xi Chen

Rong-Ke Ye

Zhou Yu

Zicheng Xu

Peijian Zhang

Xing-Fa Huang

Changyu He

Sheng Qiu

Jun Yuan

Liang Chen

Yang Pu

Xue-Liang Xu

Xiao-Feng Shen

Ming-Yuan Xu

You-Hua Wang

Xu Huang

Jiao-Xue Li

Kui Pang

Xian Chen

Zhengyuan Zhang

Yonghong Dai

Feiyu Jiang

Xiyi Liao

Yu-Jun Yang

A voltage control method and a voltage control circuit for an anti-fuse memory array, including: obtaining a storage data address, dividing the storage data address into multiple subdata addresses, decoding each subdata address to obtain a corresponding group of decoder output signals, converting the corresponding group of decoder output signals into a group of control signals by a corresponding group of high voltage converters; connecting multiple groups of data selectors in series, outputting selection voltages input to each group of data selectors to an anti-fuse unit under the control of the corresponding group of control signals; programming or reading an anti-fuse unit; the selection voltages include one of a programming selection voltage, a reading selection voltage, and a non-designated selection voltage. The present disclosure reduces the number of transistors and saves layout areas when the programming or reading operation is performed.

Voltage control method and voltage control circuit for anti-fuse memory array

A multi-bit resolution sub-pipeline structure for measuring a jump magnitude of a transmission curve, comprising: a sub-analog-to-digital converter having n-bit resolution configured to quantize input analog voltage signals and output digital voltage signals; a sub-digital-to-analog converter having n-bit resolution configured to convert the digital voltage signals output by the sub-analog-to-digital converter into corresponding analog voltage signals; a decoder having n-bit resolution configured to decode an n-bit binary input signal; and a switched-capacitor amplification unit configured to, when in a normal mode, perform sampling and residue amplification on the input analog voltage signals; and when in a test mode, measure the jump magnitude of the transmission curve corresponding to each decision level. Magnitude measurement of a transmission curve is performed within 2clock periods, th and a measurement result is sent to a back-end digital domain of the A/D converter for correction.

Multi-bit resolution sub-pipeline structure for measuring jump magnitude of transmission curve

SAR ADC and sampling method based on single-channel TIS. The SAR ADC comprises: a capacitor array comprising a weight capacitor and a compensation capacitor, a first switch array, a second switch array, a channel switch group and a sampling switch; when in a sampling state: a lower plate of the weight capacitor is connected to an input voltage by means of the first switch array, and an upper plate of the capacitor array is connected to a common mode voltage by the sampling switch and the channel switch group; when in a successive approximation state: the lower plate of the weight capacitor is connected to a reference voltage by the second switch array. Input signals are sampled by using a unified to sampling switch, which solves the problem in the traditional technology that sampling moments are mismatched due to different sampling signals in each time-interleaved channel.

SAR ADC and sampling method based on single-channel time-interleaved-sampling

The present disclosure provides a low-jitter frequency division clock circuit, including: a clock control signal generation circuit, to generate clock signals having different phases; a low-level narrow pulse width clock control signal generation circuit, to generate a low-level narrow pulse width clock control signal; a high-level narrow pulse width clock control signal generation circuit, to generate a high-level narrow pulse width clock control signal; and a frequency division clock generation circuit, to generate a frequency division clock signal according to low-level narrow pulse width clock control signal and high-level narrow pulse width clock control signal. The delay from a clock input end to an output end of low-jitter frequency division clock circuit is up to three logic gates. Compared with traditional divide-by-2 frequency division clock circuits based on D-flip-flop, the low-jitter frequency division clock circuit of the present disclosure has fewer logic gates, a shorter delay, and lower jitter.

Low-jitter frequency division clock clock circuit

The present disclosure provides a differential reference voltage buffer, including: a buffer stage, including at least a first transistor and a second transistor; a control circuit, connected with the buffer stage and forming a negative feedback structure for generating a differential reference voltage; a current compensation circuit for compensating a resistive load current of the control circuit; and a drive stage for generating an output differential reference voltage. The differential reference voltage is generated according to an external input reference voltage and a common mode input voltage. The common mode voltage can be set separately, so that the flexibility is high. The current generated by a resistive network in the control circuit is compensated by the current compensation circuit, so that the current of a follow device in the buffer stage is not influenced by the control circuit, thereby generating a differential reference voltage with high accuracy output.

Differential reference voltage buffer

The present invention provides a chip ESD protection circuit, includes an integrated circuit layer and a conductive layer. A first ground bonding pad that is connected to a first ground wire of a first power domain is disposed on each of the first power domain and a second power domain in the integrated circuit layer. The first ground bonding pads are bonded to the conductive layer. A second power clamping unit is disposed on the second power domain. A first end of the second power clamping unit is connected to a second power wire of the second power domain, and a second end thereof is connected to the first ground wire or a second ground wire of the second power domain. According to the chip ESD protection circuit, the ESD protection capability of a chip can be improved. The occupied area of the chip is reduced.

Chip ESD protection circuit

A sampling device includes a switch capacitor circuit. First ends of two switches are respectively connected to an input signal. Second end of the first switch is connected to an upper plate of a first capacitor. Second end of the second switch is connected to a lower plate of a second capacitor. A connection node connecting a lower plate of the first capacitor to an upper plate of the second capacitor is connected to a power source. The first ends of a third switch and a fourth switch are respectively connected to an input common-mode voltage. A second end of the third switch is connected to the upper plate of the first capacitor. A second end of the fourth switch is connected to the lower plate of the second capacitor. The connection node is connected to the power source. Thus, an output common-mode voltage of the sampling device is adjustable.

Sampling device

A dither circuit for high-resolution analog-to-digital converters (ADCs) is presented, including a settable pseudorandom sequence generator, a trimming module, a trimmable digital-to-analog conversion circuit, a dither introduced circuit and a dither elimination circuit, wherein the settable pseudorandom sequence generator works to generate pseudorandom sequence signal uncorrelated to analog input signal and its output can be set, of which n bit output is taken as digital dither signal and n can be less than the quantization bit of the ADC; the trimming module works to determine the trimming signals for the trimmable digital-to-analog conversion circuit to convert the digital dither signal into analog dither signal precisely; the dither introduced circuit works to introduce the analog dither signal to the ADC; the dither elimination circuit works to remove the digital dither signal from the output of ADC. The dither circuit features less complexity and better dynamic performance for high-resolution ADC.

Dither circuit for high-resolution analog-to-digital converters

A high-speed sampling front-end circuit is presented that includes a MDAC sampling network, a reference voltage generator circuit, a comparator array, an operational amplifier, an output short-circuit switch, an adjustable clock duty cycle stabilizer, a status control module and a feedback control module. The circuit features low power, high sampling rate and high input bandwidth of sampling network. The time constant of the MDAC sampling network and the comparator array is precisely matched one another to improve input bandwidth of the sampling network. Sampling capacitors are designed as feedback capacitors and DAC calculation capacitors, thereby the operational amplifier doubles feedback coefficient and features 50% bandwidth and 50% power. The cycle stabilizer is adopted to shorten sampling time and extend amplification phase to greatly improve sampling rate. One input reference voltage tends to simplify the design of the reference voltage generator circuit. The circuit has wide applications in pipelined A/D converters.

High speed sampling front-end circuit

A successive approximation analog-to-digital converter and conversion method thereof are provided, the successive approximation analog-to-digital converter includes a segmented-multiple-stage capacitor array with redundancy bits, a comparator, a weight-storage circuit, a code reconstruction circuit and a control logic circuit. The successive approximation analog-to-digital converter helps to decrease the complexity of circuit design, featuring small size and low power. Without auxiliary capacitor array, switches and control logic, the circuit can work to precisely measure and correct capacitor mismatch errors.

Successive approximation analog-to-digital converter and conversion method thereof

A high-linearity CMOS input buffer circuit is provided for neutralizing non-linearity of follower circuits' transconductance and output impedance resulting from input signals' variation. In doing so, the linearity of CMOS input buffer is improved. The buffer circuit includes a CMOS input follower circuit, a linearity improvement circuit of follower transistor, a current source load, and a linearity improvement circuit of load impedance. The buffer circuit is fabricated in standard CMOS process, featuring low cost, simplicity and strong linearity at high frequency. It has wide applications in analog and hybrid analog-digital CMOS ICs requiring high linearity input buffer.

CMOS input buffer circuit

A layout design method is provided for generating capacitor arrays being described in four steps: first, the wiring mode of unit capacitors is defined allowing the wire being connected to the upper plate to parallel that to the lower one, second, a capacitor array layout is designed with capacitors being distributed in Mh lines, Mh is the maximum of capacitors' lines, the line numbers of Class 1 to Class K capacitors are defined in the unilateral capacitor array, third, the wiring mode is set for capacitor array making sure the lengths of the wires to the upper and lower plates of unit capacitors are equal, at last, parasitic parameters are characterized in ways that verify the layout. A capacitor array is provided as well. By eliminating capacitance mismatching caused by parasitic capacitance, the method works to generate a well-matched capacitor array in an easy and efficient way.

Capacitor array and layout design method thereof

Gasoline engine

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Chongqing, China

Yan Wang