Amazon Technologies, Inc.

Yan Karasik

Scott Dylewski

Prashanth Basavaraj Patil

According to one or more embodiments of the disclosure, a testing apparatus is provided. The testing apparatus may include a base portion configured to receive a device under test (DUT). The base portion may also include an array of light sensors to measure light leakage from the DUT. For example, the testing apparatus may receive, from the array of light sensors, one or more light intensity measurements associated with light leakage from between a bezel element and a display element along a first edge portion of the DUT. The testing apparatus may then transmit the measurements to a testing computer.

Growing community of inventors

Sunnyvale, CA, United States of America

Yan Karasik