Nortel Networks Corporation

Nxstage Medical, Inc.

Coretek, Inc.

Ahura Corporation

Yakov Kogan

Daryoosh Vakhshoori

Scott W Newell

Parviz Tayebati

Reich L Watterson

Farhang Sakhitab

Donald McDaniel

Kevin John McCallion

Peidong Wang

Donald L McDaniel, Jr

Michael R Letsch

Mark A Lykam

A system for measuring electrical conductivity includes a fluid conduction measuring circuit and a temperature measuring element having at least one thermal contact portion with a temperature sensor and a temperature measuring circuit. A controller is configured to control the conduction measuring circuit and the temperature measuring element. A fluid circuit is configured to carry a fluid and has a wetted conductor inside a conductivity cell portion, the wetted conductor having a contact, external to the fluid circuit, for interfacing with the fluid conduction measuring circuit. Further, at least one temperature measurement portion has predefined thermal properties and is configured to touch the thermal contact portion. The controller controls the temperature measuring element and the conduction measuring circuit to generate and output at least one set of contemporaneous temperature and conduction measurements.

Fluid property measurement devices, methods, and systems

Systems, methods, and devices can detect a dangerous or adverse condition or anticipated condition that indicates an undesirable amount of electric current in a patient-connected tube providing fluid to a patient. The fluid flow to the patient is stopped responsive to the detection. Stoppage of fluid flow to the patient can reduce or prevent electric current in the fluid from reaching a patient, flowing through the patient to ground, and/or continuing to flow through the patient.

Electrical safety methods, devices, and systems for medical treatment devices

High accuracy temperature measurement devices, methods, and systems for measuring the temperature of medical fluids are described. In embodiments, the devices have the features that they are compatible with the measurement of temperatures in a sealed fluid circuit, thereby promoting compatibility with sterile disposable circuits. Also described are combinations of temperature sensors and conductivity measurement for precise determination of the concentration of ions in a medicament.

A pressure sensor is disclosed for measuring fluid pressure comprising a pressure sensing structure comprising a mass target suspended on a spring mechanism, wherein the mass target and the spring mechanism together exhibit high Q mechanical resonance, wherein the mass target has an area which is presented in a plane perpendicular to the direction of the mechanical oscillation of the structure, and further wherein the mass target and the spring mechanism are in the form of a membrane, and transducer means for measuring the fluid pressure by characterizing the effects that the fluid molecules produce on the motion of the structure.

Micro-electro-mechanical pressure sensor

Apparatus and methods are provided for measuring a selected optical behavior of a tunable opto-electric device by using the electrical characteristics of the opto-electronic device. The benefit of the present invention is the elimination or reduction in complexity of optical wavelength reference hardware that is currently required for wavelength referencing and locking. Accordingly, the present invention reduces the cost and complexity of the optical packaging of tunable opto-electronic telecommunication components. Furthermore, the present invention also significantly simplifies optical and electronic design of system level products with tunable opto-electronic devices.

Electronic method and apparatus for measuring optical wavelength and locking to a set optical wavelength of Fabry-Perot tunable cavity opto-electronic devices

Apparatus and methods are provided for automated semiconductor device probing. The apparatus includes a probe assembly; a machine vision system; and a semiconductor support fixture. A method includes providing apparatus for automated semiconductor device probing; locating the semiconductor device positioned on the semiconductor support fixture with the machine vision system; guiding the movement of at least one of the probe assembly and the semiconductor support fixture so as to position a contact portion of the semiconductor device and the electrical probe in alignment with one another; and moving at least one of the probe assembly and the semiconductor support fixture toward the other of the at least one of the probe assembly and the semiconductor support fixture so as to position the electrical probe and the contact portion of the semiconductor device in electrical connection with one another.

Automated semiconductor probing device

According to an aspect of the present invention, a circuit is provided for determining the wavelength and power of a given optical signal across a wide dynamic range. The wavelength and power determinations are performed by logarithmic ratio amplifier in concert with a digital signal processor that utilizes representative equations of the measured optical signal.

Method and apparatus for wavelength and power measurement for tunable laser control

Method and apparatus for optically aligning, for subsequent assembly into discrete packages, opto-mechanical components, e.g., optical filters, and lenses for directing direct light to and from those opto-mechanical components. The apparatus comprises a light source for producing a beam of light emulating the light which exists in the assembled package of components during use, manipulator means for supporting a lens and a selected opto-mechanical component in tandem along the optical axis of the light beam and for moving the lens and selected opto-mechanical component along X and Y axes perpendicular to that optical axis, and a machine vision system having imaging means for recording images of the light beam and the opto-mechanical component and being adapted to control operation of the manipulator means so as to cause the latter to shift the lens and opto-mechanical component along the X and/or Y axes to achieve optical alignment.

Method and apparatus for precision alignment and assembly of opto-electronic components for fiber-optic networks

A method and apparatus is provided for calibrating a Fabry-Perot etalon based optical measurement system. The calibration is performed by analyzing the shape of transmission peaks output from the etalon in response to a known optical signal and using that information, along with a formula that approximates the response of the etalon, to perform the calibration.

Method and apparatus for calibrating a fabry-perot interferometer based measurement system

Apparatus for placement of an optical component on a substrate. The apparatus includes a machine vision system for locating the optical component on the substrate, a contact determiner for determining contact therebetween, and a robot for contacting the optical component and the substrate with one another, and for moving the optical component and the substrate relative to one another under guidance from the machine vision system toward a desired position, wherein the optical component and the substrate contact one another for a portion of the movement. A method includes contacting the optical component with the substrate, locating the optical component on the substrate, and moving the optical component and the substrate relative to one another toward a desired position of the optical component on the substrate, wherein the optical component and the substrate contact one another for a portion of the moving.

Placement of an optical component on a substrate

According to an aspect of the present invention, a power detector including a photodiode and a logarithmic transimpedance amplifier is mounted inside a hermetically sealed package in such a way that the photodiode and the logarithmic transimpedance amplifier are located on the same thermally conductive substrate.

Wide dynamic range optical power detector

A method and an automated apparatus for three-dimensional optical alignment of optical components for testing or assembly purposes comprise use of a visible light vision system to assist active alignment of optical components based on the measured optical output at a wavelength of light outside of the visible range.

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Bedford, MA, United States of America

Yakov Kogan