Saifun Semiconductors Ltd.

Infineon Technologies LLC

Spansion Israel Ltd

Yair Sofer

Eduardo Maayan

Yoram Betser

Amichai Givant

Joseph Shor

Shivananda Shetty

Oren Shlomo

Yoav Yogev

Boaz Eitan

Pawan Kishore Singh

Amir Rochman

Avri Harush

Yi He

Oleg Dadashev

Ron Eliyahu

Stefano Amato

Ori Elyada

Itzic Cohen

Idan Koren

Shahar Atir

Eran Geyari

Systems, methods, and devices prevent data loss in memory devices. Systems may include a non-volatile memory device that includes a first data unit configured to store data for the non-volatile memory device and associated metadata, and a second data unit configured to store data for the non-volatile memory device and associated metadata, wherein the first data unit and second data unit are configured to alternate storing a most recent version of the data and associated metadata. The systems may also include control circuitry configured to read metadata from the first data unit and the second data unit, identify the first data unit as an inactive data unit based on contents of the first data unit and the second data unit, and perform one or more update operations such that the first data unit is updated and set as an active unit when the update operations are complete.

Data loss protection for memory systems and devices

In an embodiment, a method includes: receiving a first program bit address associated with a plurality of redundant bit addresses and a first transistor-based memory cell, where the plurality of redundant bit addresses are each associated with a respective transistor-based memory cell; providing a programing pulse to a first word line coupled to the first transistor-based memory cell to write a first write value to the first transistor-based memory cell; reading a first bit value from the first transistor-based memory cell; reading redundant bit values from transistor-based memory cells associated with the plurality of redundant bit addresses; when one of the first bit value and the redundant bit values do not match the first write value, determining a majority bit value based on the first bit value and on the redundant bit values; and asserting a flag signal when the majority bit value does not match the first write value.

One-time programmable (ROTP) NVM

Systems, methods, and devices implement counters with fault tolerance and power loss protection. Systems include a non-volatile memory device that includes a first counter configured to store a first plurality of data values representing a plurality of count operations, and a second counter configured to store a second plurality of data values representing an initiation and a completion of each erase operation performed on the first counter. Systems also include control circuitry configured to generate a count value based on a current counter value of the first counter, a current counter value of the second counter, and at least one physical parameter of the first counter.

Continuous monotonic counter for memory devices

Memory devices and methods for operating the same are provided. Generally, the device includes an array of multibit-memory-cells, each operable to store multiple bits in separate locations of a charge-trapping layer, and control-circuitry coupled to the array. The control-circuitry is operable read 1st and 2nd bit values of each cell individually based on generated first and second sensed currents, where the first and second sensed currents correspond to charges trapped in first and second bit locations. The control-circuitry executes an algorithm based on the first and second sensed currents and determines a logic state of the cell. In one embodiment, the control-circuitry averages the sensed currents, and compares this to a reference current to determine the logic state. In another, the 2nd bit value is a complement of the 1st, and the control-circuitry compares the currents to determine the logic state without use of a reference current.

Multibit memory device and method of operating the same

Systems, methods, and devices include counters configured to implement count operations. Systems include non-volatile memory devices which include a first counter configured to store a first plurality of data values representing a plurality of count operations, and a second counter configured to store a second plurality of data values representing a number of erase operations applied to the first counter. Systems further include control circuitry configured to implement read, write, and erase operations for the first counter and the second counter, determine a partial count value based, at least in part, on a current value of the second counter and at least one physical parameter of the first counter, and generate a count value by adding the partial count value with a current value of the first counter. Such counters and control circuitry are immune data loss due to power loss events.

A system and method for protecting against a voltage glitch are provided. Generally, the system includes a reset-detector coupled to a supply voltage (VCC) and to a power-on-reset (POR) block, and a glitch-detector coupled to VCC and the reset-detector. The reset-detector is operable to provide a signal to the POR block to generate a global-reset-signal when VCC decreases below a minimum and remains low for at least a first time. The glitch-detector is operable to provide a glitch-signal to the reset-detector to cause it to provide the signal to the POR block when VCC decreases below the minimum and remains low for at least a second time, where the second time is less than the first. The reset-detector can further include a retention-circuit operable to recall a glitch-signal was received and signal the POR block when VCC is restored. Other embodiments are also disclosed.

Glitch protection system and reset scheme for secure memory devices

A method of reducing read disturb in NVM cells by using a first drain voltage to read the array cells and using a second, lower drain voltage, to read the reference cells. Drain voltages on global bitlines (GBLs) for both the array and the reference cells may be substantially the same as one another to maintain main path capacitance matching, while drain voltages on local bitlines (LBLs) for the reference cells may be lower than the drain voltage on local bitlines (LBLs) for the array cells to reduce second bit effect. Reducing the drain voltage of the reference cell at its drain port may be performed using a clamping device or a voltage drop device.

Minimizing read disturb in an array flash cell

Disclosed is a method of reducing the neighbor effect while reading data in a non-volatile memory array. The method includes sensing adjacent memory cells. The sensing of the two adjacent cells is performed substantially simultaneously and through at least a partially shared sensing path.

Method for reading a memory array with neighbor effect cancellation

A method for operating a non-volatile memory cell device, the method including providing an array of memory array cells connected to word lines and local bit lines, the local bit lines being connected to global bit lines via select transistors, the array being divided into isolated sectors, providing a sense amplifier operative to sense the memory array cells via a sensing path that includes at least one of the local bit lines, at least one of the select transistors, at least one accessed global bit line, and a YMUX, providing a reference cell located in a reference mini-array, the reference cell being connected to the YMUX and being connected to the sense amplifier via another sensing path, driving both the memory array cells and the reference cells with a common bit line (BL) driver connected to the memory array cells and the reference cells via the YMUX through accessed global bit lines, and matching the sensing path of the memory array cell and the sensing path of the reference cell to the sense amplifier by using a non-accessed global bit line in the sensing path between the reference cell and the sense amplifier. The non-accessed global bit line may be dynamically chosen as the global bit line adjacent to the global bit line used for driving both the drains of the array and the reference cells.

Dynamic matching of signal path and reference path for sensing

Circuitry including a BGREF (bandgap voltage reference) comparator including a plurality of MOS transistors that compare a resistor divided supply voltage to a function of at least two process parameter voltages.

Power-up and BGREF circuitry

A replenish circuit for a semiconductor memory device, including a bias current generating unit adapted to generate a bias current, a frequency controllable oscillator adapted to receive the bias current and to provide an oscillating output, and a pulse generator adapted to receive the oscillating output and to generate first and second pulses as a function of the oscillating output, the second pulse being embedded in the first pulse, the first pulse causing the bias current generating unit to be connected to a power supply, and the second pulse being fed to sample-and-hold circuitry adapted to sample the bias current and hold the value thereof during the first pulse.

Replenishment for internal voltage

The present invention consists of a method and system for compensating, over time and over an operating temperature range, for margin loss in a non-volatile memory ('NVM') cell, which method comprises selection of a reference level based on temperature readings obtained from a temperature sensing element that is thermally coupled, directly or indirectly, to the NVM cell. The reference level may be selected from a group consisting of references levels of various types, or it may be obtained by adjusting the output of a single reference based on the temperature reading(s), or it may be obtained by utilizing pre-stored conversion data, which conversion data associates a given temperature reading with a corresponding temperature range that is, in turn, associated with a corresponding reference level. A pool of likewise reference cells may be provided, and the reference level may be selected from this pool, based on its association to the temperature reading. The pool of reference cells may consist of Program verify reference cells, or Erase verify reference cells.

Method circuit and system for compensating for temperature induced margin loss in non-volatile memory cells

A method for erasing a non-volatile memory cell array, the method including applying an erase pulse to at least one bit of at least one memory cell of the array, erase verifying the at least one bit with a first erase verify level, and if the bit has passed the first erase verify level, applying at least one more erase pulse to the at least one bit.

Method for erasing a memory cell

A charge pump regulator for providing a constant boosted voltage at the output of a charge pump includes: 1) a charge pump; 2) a clamping regulator; and 3) a clamping transistor. Certain preferred embodiments further include an auxiliary charge pump that provides a voltage above V or below ground to the clamping regulator. The clamping transistor provides a voltage supply level (Vsupp) to the oscillating clock signal generator which uses Vsupp to drive the oscillating clock signals that charge the energy injection capacitors of the charge pump between Vsupp and a reference voltage (Vref). The invention includes regulators for use with positive and negative charge pumps.

Growing community of inventors

Tel Aviv, Israel

Yair Sofer