Adaptas Solutions Pty Ltd

Etp Electron Multipliers Pty Ltd.

Yair Benari

Kevin Hunter

Russell Jurek

Wayne Sheils

Richard Whitney Stresau

Richard Stresau

Toby Shanley

Peter Raffin

An apparatus for providing a magnetic field includes a magnet having a surface, and a structure disposed above the magnet surface. The structure includes a material of high magnetic permeability. The apparatus provides an interface between the material of high magnetic permeability and a material of low magnetic permeability. The apparatus may have two poles in magnetic communication with the magnet, the poles extending above the surface of the magnet, and the structure is disposed between the poles. The structure may have alternating regions of high magnetic permeability and low magnetic permeability. The apparatus alters the magnetic field of the magnet to reduce or remove a disorder in the magnetic field, and/or decrease the magnitude of the magnetic field, and/or induce a distortion in the magnetic field, and/or align or re-align the magnetic field, and/or orientate or re-orientate the magnetic field, and/or alter distribution or shape of the magnetic field.

Apparatus and methods for controlling a charged particle in a magnetic field

Electron focussing apparatus includes a cathode plate defining an impact surface on which particles impact, which surface has a finite probability of generating at least one electron for each impacting particle having predetermined characteristics. The apparatus also has an electron receiving element, and respective means for generating electrostatic and magnetic fields in a space extending from the impact surface to the electron receiving element. The means for generating the electrostatic and magnetic fields are configured whereby the E/Bratio adjacent the electron receiving element is smaller than adjacent the impact surface, whereby to decrease the radius of curvature of the electron trajectories adjacent the electron receiving element relative to adjacent the impact surface and to thereby focus the electron trajectories in at least one dimension. In another aspect the electron receiving element is positioned and the means for generating the electrostatic and magnetic fields are configured to cause the electrons to deflect on average through greater than 180&#xb0; before impacting the electron receiving element, whereby to focus, in at least one dimension, multiple electrons generated from any given area of the impact surface to a smaller area at the electron receiving element.

Particle detection by electron multiplication

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Hornsby, Australia

Yair Benari