Koninklijke Philips Corporation N.v.

Yael Nae

Amar Chandra Dhanantwari

Andrei Feldman

Mukta Joshi

Idan Mishlovsky

Dhruv Mehta

Suresh Narayanan

The present invention relates to optimizing values for scan parameters for a scan of an object. An object specific exposure time is determined based on a maximal required value of a z-dependent tube current by exposure time product along a z-axis of the object and a maximal available tube current value of a tube used for the scan of the object (). The maximal available tube current value depends on a tube voltage and maximal electric power of the tube at given focal spot area () and the z-dependent tube current by exposure time product profile is based on a dose index value or a pixel noise index value for the scan of the object, the tube voltage, and a z-dependent object size along the z-axis (). The object specific exposure time is used for determining values of the scan parameters for the scan of the object ().

CT scan parameter optimization

A method includes processing projection data with a first reconstruction algorithm and reconstructing first reconstructed volumetric image data, wherein the first reconstructed volumetric image data has a first 3D noise function. The method further includes processing the same projection data with a second different reconstruction algorithm and reconstructing second reconstructed volumetric image data, wherein the second reconstructed volumetric image data has a second 3D noise function, which is different from the first 3D noise function. The method further includes visually presenting the first or the second reconstructed volumetric image data in a main viewport. The method further includes visually presenting a sub-portion the other of the first or the second reconstructed volumetric image data in a region of interest overlaid over a sub-portion of the main viewport.

Reconstructed image data visualization

A method includes determining a low contrast detectability of a scan and generating an image quality index based on the determined low contrast detectability. Another method includes identifying an image quality index of interest, identifying an acquisition and/or reconstruction parameter based on the image quality index and a pre-determined mapping between image quality indexes and acquisition parameter and reconstruction parameters, and displaying the identified acquisition and/or the reconstruction parameter. A system () includes a metric determiner () that determines a first image quality index for a scan based on at least one of a low contrast detectability of the scan or a project domain noise of the scan, and/or a parameter recommender () that recommends at least one of an acquisition or a reconstruction parameter for a scan based on a second image quality index, and a display () that visually presents the first or second image quality index.

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Haifa, Israel

Yael Nae