Emagin Corporation

Fed Corporation

Yachin Liu

Amalkumar P Ghosh

Steven M Zimmerman

Gary W Jones

Susan K Schwartz Jones

Hua Xia Ji

Jeffrey R Marino

Susan K Jones

Christian M Heller

Michael J Costa

Jeffrey A Silvernail

Joseph K Ho

R Mark Boysel

A process of cleaning wire bond pads associated with OLED devices, including the steps of depositing on the wire bond pads one or more layers of ablatable material, and ablating the one or more layers with a laser, thereby exposing a clean wire bond pad.

Method of clearing electrical contact pads in thin film sealed OLED devices

A method of reducing the internal reflected light in an OLED device comprising the step of either scattering light emitted from the OLED or removing light emitted from the OLED. An OLED device comprising a color changing medium film, a transparent substrate, and either a means for scattering light emitted from the OLED or a means for removing light emitted from the OLED such that the internal reflected light is reduced.

Light extraction from color changing medium layers in organic light emitting diode devices

The present invention is directed to an apparatus and method of solder-sealing an active matrix OLED display using a monochromatic solid-state laser beam ( ). The solder-sealing apparatus comprises a cover assembly ( ) adapted to be positioned over at least one OLED ( ) on a substrate ( ), a sealing band ( ) surrounding each OLED, a chuck assembly ( ) with an array of heat sinks ( ) that align with the OLEDs, a pick-up assembly ( ) with at least one aperture ( ), and a flange assembly ( ) to which a solder pre-form ( ) is secured. The chuck assembly ( ) receives, aligns and orients the substrate ( ). A vacuum is then applied through each aperture ( ) to align and hold the cover assembly ( ) in place. The sealing band ( ) and solder pre-form ( ) are aligned and pressed together by the pick-up assembly ( ), and the focused laser beam ( ) is projected through the chuck assembly to seal the OLEDs ( ) within the cover assembly ( ).

Apparatus and method for solder-sealing an active matrix organic light emitting diode

An interferometric lithographic apparatus includes an arrangement for applying interfering laser beams to a part for producing a first interference pattern. The first interference pattern has a first fringe spacing. A mobile part holder stage is repositioned to change the interference pattern and produce a second fringe spacing. A control arrangement, automatically responsive to the repositioning of the part holder, re-aligns optical paths and optimally interferes the laser beams to produce the second fringe spacing.

Laser interferometric lithographic system providing automatic change of

A field emitter device includes a column conductor, an insulator, and a resistor structure for advantageously limiting current in a field emitter array. A wide column conductor is deposited on an insulating substrate. An insulator is laid over the column conductor. A high resistance layer is placed on the insulator and is physically isolated from the column conductor. The high resistance material may be chromium oxide or 10%-50% wt % Cr+SiO. A group of microtip electron emitters is placed over the high resistance layer. A low resistance strap interconnects the column conductor with the high resistance layer to connect in an electrical series circuit the column conductor, the high resistance layer, and the group of electron emitters. One or more layers of insulator and a gate electrode, all with cavities for the electron emitters, are laid over the high resistance material. One layer of insulator is selected from a group of materials including SiC, SiO, and Si.sub.3 N.sub.4. An anode plate is attached with intermediate space between the anode plate and the microtip electron emitters being evacuated.

Field emitter device with a current limiter structure

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Poughkeepsie, NY, United States of America

Yachin Liu