No. 24 Research Institute of China Electronics Technology Group Corporation

Chongqing Gigachip Technology Co. Ltd.

China Electronics Technology Group Corporation No. 24 Research Institute

Yabo Ni

Ting Li

Yong Zhang

Dongbing Fu

Zhengbo Huang

Guangbing Chen

Jian'an Wang

Ruzhang Li

Gangyi Hu

Liang Li

Jianan Wang

Zicheng Xu

Huaiqiang Yu

Chao Chen

Xiaofeng Shen

Can Zhu

Xingfa Huang

Lu Liu

Jun Yuan

Jiahao Peng

A method for correcting an analog-to-digital converter includes the following steps: extracting gain errors and weight errors of all conversion stages of an analog-to-digital converter; performing first correction on the analog-to-digital converter based on the gain errors and the weight errors; extracting jitter errors of all conversion stages of the analog-to-digital converter after the first correction; and performing a second correction on the analog-to-digital converter based on the jitter errors. According to the disclosure, the gain errors, the weight errors, and the jitter errors of all conversion stages are successively extracted, and then the analog-to-digital converter is corrected. Precision after the corrections is higher. An actual weight of each quantization unit at each conversion stage, an actual inter-stage gain of each conversion stage and an actual weight of jitter are extracted, impact of a jitter weight is eliminated during outputting, and a signal-to-noise ratio of analog-to-digital conversion is increased.

Method for correcting analog-to-digital converter

A method for calibrating an analog-to-digital converter includes the following steps: conducting an initial performance test and judgement on the analog-to-digital converter; if the initial performance test succeeds, performing a pre-trimming and judgement on the analog-to-digital converter; if the pre-trimming succeeds, performing an error extraction on the analog-to-digital converter, obtaining errors of conversion stages of the analog-to-digital converter; performing an error soft trimming and test on the analog-to-digital converter according to the errors of the conversion stages; and if the error soft trimming and test of the analog-to-digital converter succeed, performing an error hard trimming and test on the analog-to-digital converter according to the errors of the conversion stages.

Method for calibrating analog-to-digital converter

Embodiments of the disclosure provide a circuit, chip, system, and method for eliminating random perturbation. The circuit includes a weight calculating module for receiving digital signals and random perturbation digital quantity, using least mean square error algorithm to calculate weight deviation iteration coefficient based on digital signal and digital quantity, and updating perturbation weight in real-time according to weight deviation iteration coefficient; and a perturbation eliminating module for eliminating perturbation signal in output digital signal of quantizer according to perturbation weight updated in real-time and updating perturbation weight in real-time according to weight deviation iteration coefficient, and then calculating current perturbation weight in real time to realize self-calibration of perturbation weight. Even if the manufacturing process or working environment of the current chip changes, perturbation weight can be dynamically adjusted, to ideally eliminate perturbation signal in digital signal.

Circuits, chips, systems and methods for eliminating random perturbation

An interface circuit and an electronic apparatus, including: a programmable current array (), generating a first current and a second current transmitted to a common mode and differential mode generation circuit () according to an input code, and a third current and a fourth current transmitted to a driving bias generation circuit () according to the input code; the common mode and differential mode generation circuit (), generating a common mode voltage according to the first current, and generating a high level voltage and a low level voltage according to the second current and the common mode voltage; a driving bias generation circuit (), simulating a load according to the third and fourth currents, and generating a bias voltage based on the load and the low and high level voltages; an output driving circuit (), converting an input signal into a differential signal in which the common mode voltage and a differential mode amplitude are configurable.

Interface circuit and electronic apparatus

The present disclosure provides a substrate-enhanced comparator and electronic device, the comparator including: a cross-coupled latch, for connecting input signals to the gate of a cross-coupled MOS transistor to form a first input of the latch; output buffers, connected to the cross-coupled latch for amplifying output signals of the latch; AC couplers, connected to the output buffers for receiving and amplifying the output signals of the latch, coupling the output signals to substrates of the cross-coupled MOS transistors to form second inputs of the latch. The cross-coupled latch is also for output signal regenerative latching based on input signals sampled at the first inputs and input signals sampled at the second inputs. The present disclosure introduces additional substrate inputs to the cross-coupled structure of the conventional latch as the second inputs of the latch.

Substrate-enhanced comparator and electronic device

A highly linear time amplifier with power supply rejection. In a reset stage, the threshold value of an over-threshold detector is used for resetting an output node of an amplifier, to eliminate the impact of power supply voltage changes on the threshold value of the threshold detector. A node capacitor unit is charged under the control of an input clock signal. After completion of charging, the node capacitor unit is discharged under the control of a synchronous clock signal. The time amplification gain only depends on the proportion of the charge and discharge current, and the charging and discharging time are completely linear in principle, which eliminates the nonlinearity of the traditional time amplifier, and reduces the negative impact of threshold change on system performance.

Highly linear time amplifier with power supply rejection

A pipelined analog-to-digital converter and an output calibration method for the same. The pipelined analog-to-digital converter introduces an error calibration mechanism on the basis of traditional pipelined analog-to-digital converters through a control module, an equivalent gain error extraction module, an error storage module and a coding reconstruction module to compensate for gain errors and setup errors caused by operational amplifiers in a pipelined conversion module, so that the analog-to-digital conversion accuracy is improved, and requirements for the gain and bandwidth of the operational amplifier are relaxed, which can effectively reduce the power consumption of the analog-to-digital converter and the complexity of the corresponding analog circuit; a curve fitting method is adopted to obtain an ideal output sequence and then calculate errors; meanwhile, extraction and calibration of equivalent gain errors are all done in digital ways, and therefore accuracy thereof is high.

Pipelined analog-to-digital converter and output calibration method thereof

The present disclosure provides a buffer circuit and a buffer. The buffer circuit includes: an input follower circuit for following the voltage change of the first input signal; an input follower linearity boosting circuit for improving follower linearity of the input follower circuit; a first voltage bootstrap circuit for bootstrapping the voltage of the first input signal; a second voltage bootstrap circuit for bootstrapping the voltage of the second input signal; a third voltage bootstrap circuit for providing corresponding quiescent operation point voltage; a compensation follower circuit for following the compensation voltage; a compensation follower linearity boosting circuit for improving follower linearity of the compensation follower circuit; a first load for collecting the buffered voltage; a bias circuit for providing a bias current for the buffer; a bias linearity boosting circuit for improving linearity of the bias circuit; a second load for generating a nonlinear compensation current.

Buffer circuit and buffer

An error extraction method for foreground digital correction of a pipeline analog-to-digital converter including: acquiring a transmission curve of a pipeline analog-to-digital converter, and controlling an input signal to be within a sub-segment 0 of the transmission curve; during extraction of error information of an ith pipeline stage, setting a magnitude of the input signal according to Formula (I); locking the outputs of all previous-stage comparators in the ipipeline stage of the pipeline analog-to-digital converter; and completing, according to original output code of the pipeline analog-to-digital converter, error extraction by means of adaptive iteration, stage-by-stage, sequentially from a last stage to a first stage of a pipeline. During quantization of error value, the invention performs, by means of a fitting-based adaptive algorithm, foreground extraction of a capacitance mismatch error, a gain bandwidth error, and a kickback error in each stage of the pipeline, without any additional circuit.

Error extraction method for foreground digital correction of pipeline analog-to-digital converter

The present disclosure provides a voltage-to-time converter and method for reducing parasitic capacitance and power supply influences. The voltage-to-time converter includes: a main sampling network, a compensation sampling network, a discharge network and an over-threshold detection unit. The influence of a traditional VTC parasitic capacitance on a VTC output swing amplitude is reduced by using the compensation sampling network. A sampling common-mode level of the compensation sampling network is compensated, such that the influence of the low-frequency disturbance of a power supply voltage on a threshold of a traditional VTC threshold detection circuit is reduced. The output swing amplitude of the voltage-to-time converter of the present disclosure can reduce the influence of a parasitic capacitance. A voltage common-mode level of a VTC input end is related to a power supply voltage, which reduces a conversion error caused by the influence of the power supply voltage on a threshold.

Voltage-to-time converter and method for reducing parasitic capacitance and power supply influences

The present disclosure provides a pipelined analog-to-digital converter having input signal pre-comparison and charge redistribution, including: one-stage or multi-stage of pipelined structure unit, a first flash analog-to-digital converter, and an adjusting output unit. Each stage of the pipelined structure unit is used to quantify the input signal. The first flash analog-to-digital converter quantizes a residual signal output by a final pipelined structure unit, and outputs a corresponding quantized value. The adjusting output unit combines each of the quantized values according to a connection order of the multi-stage pipelined structure unit and a flash analog-to-digital conversion unit to output a complete quantization result. By using the pre-comparison and charge redistribution technologies, the number of comparators of different stages of pipelined sub ADC is reduced and the low power consumption design is achieved, signal sample-and-hold and residual signal amplification establishing are simultaneously carried out, thus improving the conversion rate.

Pipelined analog-to-digital converter having input signal pre-comparison and charge redistribution

The present disclosure relates to the field of semiconductor integrated circuits, and to a method for calibrating a capacitor voltage coefficient of a high-precision successive approximation analog-to-digital converter (SAR ADC). The method includes: calibrating a voltage coefficient; obtaining a sampled charged charge according to a capacitance model with the voltage coefficient; according to an INL value obtained by testing, first verifying whether a maximum value of INL occurs in the place shown in Equation 3, then obtaining two very close second-order capacitor voltage coefficients according to Equation 4, and taking an average value thereof as a second-order capacitor voltage coefficient; and then calibrating the second-order capacitor voltage coefficient in a digital domain. In the present disclosure, a capacitor voltage coefficient can be extracted based on INL and the capacitor voltage coefficient is calibrated at a digital backend without adding an analog calibration circuit, thereby improving conversion accuracy of the ADC.

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Chongqing, China

Yabo Ni