Fulian Precision Electronics (Tianjin) Co., Ltd.

Ya-Nan Bian

Duo Qiu

Wei-Chen Lin

An automatic testing method includes obtaining a positioning image, analyzing position of a plurality of slots of the test motherboard in the positioning image to generate route information for insertion and testing of components; wherein photographing test motherboard and obtaining positioning image focused on the test motherboard, controlling the clamping device to insert a plurality of the components into the slots according to the route information, controlling the test motherboard to test the components, determining if there is a faulty component, controlling the clamping device to withdraw and insert the components into other slots according to the route information and controlling the test motherboard to retest the components again if there is no faulty component. An automatic testing device and a non-volatile storage medium performing the above-described method are also disclosed.

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Tianjin, China

Ya-Nan Bian