Boe Technology Group Co., Ltd.

Hefei Xinsheng Optoelectronics Technology Co., Ltd.

Hefei Boe Display Technology Co., Ltd.

Xutong Chen

Jinbao Zhang

Honglin Niu

Bin Wang

Ming Wang

Tao Li

Ke Dai

Xiaofeng Yin

Qing Ql Li

Liugang Zhou

Jianwei Sun

Yizhan Han

Yulong Xiong

Liu He

Yunyun Liang

Yun Zhu

Zhenlin Qu

Liwei Zhou

Ronghua Fan

Duanduan Ding

Guangfei Fan

The preset disclosure provides a display control method, a timing controller IC and a display device. The method includes: acquiring a preset grayscale voltage of a target pixel unit and a backlight brightness of a backlight region corresponding to the target pixel unit, in a current output display frame; outputting a first grayscale voltage to the target pixel unit if the backlight brightness of the corresponding backlight region is less than or equal to a first preset brightness value; outputting a second grayscale voltage to the target pixel unit if the backlight brightness of the corresponding backlight region is greater than the first preset brightness value; wherein the second grayscale voltage is greater than the first grayscale voltage, and both the second grayscale voltage and the first grayscale voltage are greater than the preset grayscale voltage.

Display control method, timing controller IC, and display device

A film feeding apparatus and a control method thereof are provided. The film feeding apparatus comprises a delivery head. A surface of the delivery head has an air suction region and an air blowing region, and the air suction region and the air blowing region respectively include an air hole; and by cooperation of air suctioning through the air hole of the air suction region and air blowing through the air hole of the air blowing region, a film is kept nearby the delivery head in a non-contact manner in the case that the delivery head adsorbs the film.

Film feeding apparatus and control method thereof

An anisotropic conductive film (ACF) cutting calibration system and method are disclosed, and the system includes: a cutter, configured to cut the ACF; an image acquisition device, configured to collect a cutting mark image of the ACF according to a predetermined period; a processing device, configured to compare the cutting mark image with a predetermined image, so as to determine an offset of a cutting mark in the cutting mark image with respect to a cutting mark in the predetermined image; and a drawing device, configured to draw the ACF and adjust a speed of drawing the ACF.

Anisotropic conductive film cutting calibration system and method

Growing community of inventors

Beijing, China

Xutong Chen