Shenzhen Futaihong Precision Industry Co., Ltd.

Fih (Hong Kong) Limited

Sutech Trading Limited

Xue-Liang Zhai

Lei Li

Ping Chen

Chang-Fa Sun

Zhi Feng Cheng

Lin-Sen Dong

Yong-Zhi Tao

Dong Li

Zhi-Qiang Jiang

Wen-Quan Xu

Chun-Ying Wang

Jian-Gui Wu

Ai-Ge Sun

Hong-Yan Li

Li-Ping Huang

Xian-Cui Du

Ming-Feng Li

A fatigue test apparatus for thin workpiece includes a supporting module, a driving mechanism, a first connecting module, a second connecting module, a first holding post, a second holding post and a computer system. The first and second connecting modules are respectively fixed to two sides of the supporting module. Ends of the first holding post and the second holding post are fixed to the first and second connecting modules. The computer system electronically connects with and controls the driving mechanism. The first holding post and the second holding post are drive to rotate by the driving mechanism.

Fatigue test apparatus for thin element of electronic device

A flexible/adjustable fixing system () for fixing a workpiece () includes an information management module (), a plurality of driving devices (), and a positioning device (). The information management module receives and processes the position information of the workpiece. The driving devices electronically couple with the information management module. The positioning device includes a platform () and a plurality of positioning pins (). One end of the workpiece is positioned in a certain area of the platform. Each respective pin is attached to a corresponding driving device. When the driving device receives an order/signal from the information management module, the positioning pin is selectably driven relative to (e.g., toward, away from) the workpiece by the driving device.

Flexible fixing system for product testing

A testing system () is used to test a flip-type electronic device (). The electronic device includes a cover () and a main body (). A hinge () connects with the cover and the main body. The testing system includes a base (), a plummer (), a flipping device () and a control device (). The plummer is fixed on the base for locking the electronic device. The flipping device is fixed on the base for opening and closing the cover of the electronic device. The control device includes an optical fiber sensor () for sensing the movement of the cover of the electronic device. The control device connects with the flipping device so as to control the flipping device.

Testing system for flip-type electronic device

A key testing apparatus () is provided. The key testing apparatus includes a base () and an actuator (). The actuator includes a testing member () and a mounting member (). The mounting member includes at least one base board () fixed to the base, a lower board (), a mounting board (), and a mounting sheet (). The lower board is adjustably attached to the base board. The mounting board is adjustably attached to the lower board. The mounting sheet is adjustably attached to the mounting board. The clamping device includes a base desk (), a clamping platform (), at least one first clamping board () and second clamping board (). The base desk is adjustably attached to the base. The clamping platform, at least one first clamping board, and at least one second clamping board are adjustably attached to the base desk.

Key testing apparatus

An exemplary testing mechanism () is used for testing for a sufficiency of a casing. The testing mechanism includes a framework () and a testing module (). The framework includes a base board () and a pillar (). One end of the pillar is mounted on the base board. The testing module includes a main board () and at least one testing pin (). The main board is slidably mounted on the pillar. A bottom end of the testing pin is slidably mounted to the main board. A top end of the testing pin is positioned adjacent to the base board of the framework. The at least one testing pin is located in a position corresponding to at least one mounting hole of a sufficient casing.

Testing mechanism for casings

A testing system for testing flatness of a surface of a workpiece includes a testing apparatus () and a processor (). The testing apparatus includes a testing box () and a measuring apparatus (). The testing box includes a plurality of holders (); the holders define a datum plane. The measuring apparatus comprises a plurality of movable testing poles () extending out of the testing box and a plurality of gauges () configured for measuring distance of the testing poles retracting into the testing box. Ends () of the testing poles away from the testing box are located at the datum plane and configured for supporting the surface of the workpiece thereon to allow the gauges measuring retracting distance of the testing poles under the pressure of the workpiece. The retracting distance of the testing poles is equal to distances between testing points on the surface of the workpieces and the datum plane. The processor is connected to the testing apparatus for receiving and processing testing data that are converted from the retracting distance of the testing poles measured by the gauges.

Testing system for flatness and parallelism

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Xue-Liang Zhai