Boe Technology Group Co., Ltd.

Hefei Boe Optoelectronics Technology Co., Ltd.

Xiujuan Cui

Guilin Liu

Jingjing Li

Hongyan Zhang

Juan Li

Shanshan Yu

Qiming Li

Jian Li

Wenjie Xu

Embodiments of the present disclosure provide a pixel unit, a display substrate, and a method for manufacturing the display substrate. The pixel unit includes: a first sub-pixel region; a second sub-pixel region located at a periphery of the first sub-pixel region and surrounding the first sub-pixel region; and a third sub-pixel region located at a periphery of the second sub-pixel region and surrounding the second sub-pixel region.

Pixel unit, display substrate and method for manufacturing display substrate

The present invention relates to a method and a device for determining regions to be detected on a display motherboard. The method comprises acquiring a first image, acquiring detection parameters of the regions to be detected, acquiring second images which have a resolution higher than that of the first image, and correcting obtained detection parameters based on the second images. Compared with the prior art, the present invention can improve accuracy and efficiency of detection of a display motherboard.

Method and device for detecting boundary of region on display motherboard

The present invention relates to the technical field for detecting a display substrate, and discloses a substrate detection apparatus and a protrusion height detection method. The substrate detection apparatus comprises a carrier configured to carry a substrate to be detected as well as a sensor bracket, a height measuring sensor is disposed at one end of the sensor bracket, the height measuring sensor is of a cone structure, and a diameter of an end face, which is configured to detect the substrate to be detected, of the height measuring sensor is smaller than that of the other end face. The substrate detection apparatus and the protrusion height detection method can solve problems such as inaccurate measurement and inaccurate calculation for a height of a protrusion defect on a color filter substrate.

Substrate detection apparatus and protrusion height detection method

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Beijing, China

Xiujuan Cui