Cisco Technology, Inc.

Future Wei Technologies, Inc.

Xinli Gu

Zhiyuan Wang

Zhanglei Wang

Zhaobo Zhang

Li Li

Sung Soo Chung

Jie Xue

Jonathan M Parlan

Yaohui Xie

Hong-Shin Jun

Yufang Sun

Xiaoyi Su

Haoming Zong

Hongxia Fang

Nandakumar Krishnan

Frank Tsang

A method for diagnosing a faulty board includes generating a table of debug knowledge in accordance with predefined debug rules, and configuring a diagnostic engine in accordance with the table of debug knowledge. The method also includes subjecting the faulty board to the diagnostic engine to generate a suggested repair, receiving feedback regarding an effectiveness of the suggested repair, and reconfiguring the diagnostic engine in accordance with the feedback regarding the effectiveness of the suggested repair.

System and method for hybrid board-level diagnostics

A method of testing a multi-core network processor comprises placing the multi-core network processor in an online environment. A test is performed on a core of the multi-core network processor when the core is idle, and the core is released from the test when it is completed and resumes processing data in the online environment. In another embodiment, a network processor comprises a computer readable instructions module and a processing core. The computer readable instructions module is configured to store test instructions, and the processing core is configured to operate in an online environment and execute the test instructions to test the processing core when the processing core is idle. In yet another embodiment, an apparatus comprises a multi-core network processor that is configured to execute test instructions to perform a test on a core of the multi-core network processor when the core is idle.

Network processor online logic test

An example method is provided and includes executing a functional test for an integrated circuit and observing a failure associated with the integrated circuit. The method also includes executing a functional scan mode in order to reproduce the failure associated with the integrated circuit. A functional state of the integrated circuit is locked when the failure occurs, and the functional state is subsequently recovered for a structure test for the integrated circuit. In more particular embodiments, particular states of the functional test are evaluated and compared against other states associated with a model circuit that did not experience any failure in order to identify a latest cycle of the integrated circuit that could trigger the failure and an earliest cycle of the integrated circuit that could observe the failure.

System and method for executing functional scanning in an integrated circuit environment

An example method is provided and includes collecting inputs for a circuit board under test; evaluating historical repair records using a neuron network; providing repair actions for the circuit board based on the historical repair records; and providing an output reflecting a particular component of the circuit board to be replaced or to be repaired, where the output is associated with a developed probability of successfully fixing an issue that was identified by the test. In more specific implementations, the inputs include fault syndromes and log files associated with the circuit board under test. Additionally, at least one of the inputs of the neuron network is a syndrome vector extracted from a failure log. In yet other instances, particular outputs having higher probabilities are selected as the repair actions. The neuron network can be weighted using diagnosis knowledge weights.

System and method for providing adaptive manufacturing diagnoses in a circuit board environment

In one embodiment, the reliability of the L2 power and/or ground sub-arrays of contacts of a functional integrated circuit device is verified by applying a reference voltage to a selected contact in sub-array and sequentially measuring the voltage at other contacts in the sub-array. If the voltage levels are greater than a threshold voltage level then the functional integrated circuit device is verified as being reliable.

Monitoring of interconnect reliability using a programmable device

A clock signal within an application-specific integrated circuit (ASIC) is characterized while operating a subsystem. Subsequently, also on the ASIC, a testing clock signal is generated, based on the characterization of the operative clock signal, for purposes of testing the subsystem operating according to the testing clock signal instead of the clock signal. The ASIC includes a clock signal characterization circuit configured to characterize a clock signal within the ASIC; a programmable testing clock signal generator configured for being programmed based on said characterization of the clock signal, and for generating a test clock signal based on its said programming; and the subsystem tested when operating according to the testing clock signal instead of the clock signal.

Programmable test clock generation responsive to clock signal characterization

Resolving timing violations introduced by a logic built-in self test (LBIST) sub-circuit formed within an underlying integrated circuit includes analyzing a circuit path-list corresponding to the integrated circuit for timing violations and generating a circuit timing violations analysis output; generating a first LBIST/circuit path-list based on the circuit path-list and an LBIST path-list corresponding to the LBIST sub-circuit; analyzing the first LBIST/circuit path-list for timing violations and generating an LBIST/circuit timing violations analysis output; comparing the LBIST/circuit timing violations analysis output with the circuit timing violations analysis output; generating an LBIST/circuit constraint file based on the comparison and predetermined protocols; and generating a second LBIST/circuit path-list based on the circuit path-list, the LBIST path-list and the constraints file. In this way, timing problems are quickly and efficiently resolved.

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Sunnyvale, CA, United States of America

Xinli Gu