General Electric Company

Ge Inspection Technologies, Gmbh

Xinjun Wan

Guiju Song

Li Tao

Kevin George Harding

Clark Alexander Bendall

Steven Robert Hayashi

Shu Ching Quek

Peter James Fritz

Ming Jia

Shukuan Xu

Yana Zhang Williams

James Joseph Hoffman

Raul Munoz Medina

Charles Walter Muekmore

A measurement system comprising a light source unit, a projection unit and an optics unit is disclosed. The light source unit is configured to generate a plurality of modulated phase shifted light beams. The projection unit is configured to reflect the modulated phase shifted light beams onto an object surface. The optics unit is configured to capture the modulated phase shifted light beams from the object surface. The measurement system further comprises a photodetector and a processor. The photodetector is configured to receive the modulated phase shifted light beams from the optics unit to generate electrical signals. The processor is configured to retrieve position information of the object surface based on the electrical signals from the photodetector. A measurement method is also presented.

Measurement systems and methods

A system and method for inspecting a wind turbine for indications is disclosed. The method includes providing an inspection system spaced from the wind turbine, appraise a rotor blade of the wind turbine, and inspecting the rotor blade for indications. The inspection system includes an observation system and an inspection device, the observation system including an appraisal device and an automated scanning device, the appraisal device configured to provide an image of at least a portion of the rotor blade, the automated scanning device configured to rotate about at least one axis, shifting the image.

System and method for wind turbine inspection

A probe is presented that includes a light source, a coherent fiber bundle, and a pattern selector. The pattern selector is disposed between the light source and the proximal end of the coherent fiber bundle. The pattern selector includes at least one patterned zone through which light from the light source passes to project at least one fringe set onto a surface. Each of the at least one fringe sets has a structured-light pattern. The probe further includes an imager for obtaining at least one image of the surface and a processing unit that is configured to perform phase-shift analysis on the at least one image. A method for projecting a plurality of fringe sets suitable for phase-shift analysis on a surface using a probe is presented.

Fringe projection system and method for a probe using a coherent fiber bundle

Growing community of inventors

Shanghai, China

Xinjun Wan