Other

Cadence Design Systems, Inc.

Rutgers, the State University of New Jersey

Xinghao Chen

Joseph C Watkins

Michael L Bushnell

Deepak Kumar Mehta

Norman Scheinberg

Raghuveer Ausoori

Yanbo Tian

Omar Khan

Design for testability (DFT) algorithms, which use both gradient descent and linear programming (LP) algorithms to insert test points (TPs) and/or scanned flip-flops (SFFs) into large circuits to make them testable are described. Scanning of either all flip-flops or a subset of flip-flops is supported. The algorithms measure testability using probabilities computed from logic simulation, Shannon's entropy measure (from information theory), and spectral analysis of the circuit in the frequency domain. The DFT hardware inserter methods uses toggling rates of the flip-flops (analyzed using digital signal processing (DSP) methods) and Shannon entropy measures of flip-flops to select flip-flops for scan. The optimal insertion of the DFT hardware reduces the amount of DFT hardware, since the gradient descent and linear program optimizations trade off inserting a TP versus inserting an SFF. The linear programs find the optimal solution to the optimization, and the entropy measures are used to maximize information flow through the circuit-under-test (CUT). The methods limit the amount of additional circuit hardware for test points and scan flip-flops.

Spectral and information theoretic method of test point, partial-scan, and full-scan flip-flop insertion to improve integrated circuit testability

A scan-load-based (SLB) dynamic scan configuration reconfigures scan structures via scan-load operation, thereby eliminating interconnect network distributing configuration signals, and employs common scan circuitry identical for designs at mask level and is suitable for ASIC implementations. The architecture includes reconfigurable scan cells, apparatus for distributing configuration data to the reconfigurable scan cells and for determining desired reconfiguration data for each of the reconfigurable scan cells, and a configuration-set (CS) signal. Each of the reconfigurable scan cells has a pass-through (PT) mode in which data input, either a scan-in (SI) or a system-data (SD) of the scan cell, is transparently passed to a scan-out (SO) terminal of the scan cell without requiring a pulse on a shift clock (SC). The configuration-set (CS) signal communicates with each of the reconfigurable scan cells. A pulse on the configuration-set (CS) signal triggers PT Hold latches to capture configuration data from corresponding slave latches, which in turn set configurations of each of the reconfigurable scan cells.

Scan-load-based dynamic scan configuration

An architecture and method for improving efficiency of a Class-A power amplifier by dynamically scaling biasing current thereof as well as synchronously compensating gain thereof in order to maintain overall constant gain of the Class-A power amplifier at all biasing configurations thereof. A biasing-current switching-network is operatively connected to the back-end block of the Class-A power amplifier. A gain-control switching-network is operatively connected to a front-end block of the Class-A power amplifier. A detector-and-control block is operatively connected to an output of the back-end block of the Class-A power amplifier, and samples a signal that is then compared with reference signals to determine switching configurations in the biasing-current switching-network and the gain-control switching network when the signal is processed through the front-end block of the Class-A power amplifier followed by the back-end block of the Class-A power amplifier. The biasing-current switching-network dynamically sets the back-end block biasing current of the Class-A power amplifier for a highest possible operating efficiency. The gain-control network simultaneously adjusts gain of the front-end block of the Class-A power amplifier to synchronize with a dynamic-biasing current-switching configuration to allow overall gain of the Class-A power amplifier to be constant in all biasing conditions.

Architecture and method for improving efficiency of a class-A power amplifier by dynamically scaling biasing current thereof as well as synchronously compensating gain thereof in order to maintain overall constant gain of the class-A power amplifier at all biasing configurations thereof

A method for improving the efficiency of test sequences for circuits with embedded multiple-port arrays, such as random access memory (RAM), is described, With existing test generation methods, it is a common occurrence that a resulting test sequence only utilizes a minimum number of read ports for detecting a target fault. When this type of test sequences is applied, one or more outputs of embedded RAMs may not attain known values, consequently reducing the effectiveness of the test sequences. The present invention enhances test sequences to that when they are applied, all outputs of embedded RAMs attain known values.

Test sequences generated by automatic test pattern generation and applicable to circuits with embedded multi-port RAMs

A method for improving the efficiency of test sequences for circuits with embedded multiple-port arrays, such as random access memory (RAM), is described. With existing test generation methods, it is a common occurrence that a resulting test sequence only utilizes a minimum number of read ports for detecting a target fault. When this type of test sequences is applied, one or more outputs of embedded RAMs may not attain known values, consequently reducing the effectiveness of the test sequences. The present invention enhances test sequences so that when they are applied, all outputs of embedded RAMs attain known values.

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Endwell, NY, United States of America

Xinghao Chen