Huawei Technologies Co., Limited

Zhejiang University

Xingchang Wei

Li Zhang

Huichun Yu

Xingyun Luo

Xiaobo Huang

The present application discloses calibration system and method for an electric field probe and a magnetic field probe based on multiple components. The system includes a microstrip line calibration assembly, a clamp, a vector network analyzer and a data processing unit; two groups of microstrip lines included in the microstrip line calibration assembly can be distributed on different routing layers of the same PCB board or on independent PCB boards; the first group of microstrip lines is single microstrip lines or differential lines under common mode excitation, which are used to generate a main component Hof a magnetic field, and the second group of microstrip lines is differential lines under differential mode excitation, which are used to generate a main component Eof an electric field.

Electric field probe and magnetic field probe calibration system and method based on multiple components

The present application provides an interposer, including an interposer substrate, at least one through silicon via, a first shield layer, a first insulation layer, a first cable layout layer, and at least one first bump. The interposer substrate includes an upper surface and a lower surface; the at least one through silicon via is buried in the interposer substrate and runs through the upper surface and the lower surface; the first shield layer is disposed on the upper surface of the interposer substrate and the first shield layer has electrical conductivity; the first insulation layer is disposed at the first shield layer; the first cable layout layer is disposed at the first insulation layer and is electrically connected to the at least one through silicon via.

Growing community of inventors

Hangzhou, China

Xingchang Wei