The Ncs Testing Technology Co., Ltd.

Beijing Xiaomi Mobile Software Co., Ltd.

Boe Technology Group Co., Ltd.

Boe Optical Science and Technology Co., Ltd.

Central Iron and Steel Research Institute

Xing Yu

Haizhou Wang

Xuejing Shen

Lei Zhao

Yunhai Jia

Dongling Li

Hui Wang

Yongkang Fan

Weihao Wan

Xiaojia Li

Yuhua Lu

Suyue Liu

Peng Wang

Hao Su

Lixia Yang

Guang Feng

Zhongnan Bi

YiFei Zhu

Yongqing Wang

Hailong Qin

Qun Ren

Zhenzhen Wan

Suran Liu

Jianqiu Luo

A high-throughput 3D printing system for preparing multi-component, small sized samples, includes a raw material supply module, providing a various kinds of metal powders for printing small sized samples; the first mixer module, mixing the metal powders obtained from the raw material supply module to generate the first blended metal powders; the second mixer module, mixing the first mixed metal powders, in order to generate the second blended metal powders for printing small sized samples; the first printing module, printing the secondary blended metal powder into a small-sized sample; a control module, controlling other functional modules of the high-throughput 3D printing system for generating small-size samples.

High-throughput 3D printing system for preparing multi-component, small sized samples

An apparatus and a method for preparing glow discharge sputtering samples for materials microscopic characterization are provided. The apparatus includes a glow discharge sputtering unit, a glow discharge power supply, a gas circuit automatic control unit, a spectrometer, and a computer. The structure of the glow discharge sputtering unit is optimized to be more suitable for sample preparation by simulation. By adding a magnetic field to the glow discharge plasma, uniform sample sputtering is realized within a large size range of the sample surface. The spectrometer monitors multi-element signal in a depth direction of the sample sputtering, so that precise preparation of different layer microstructures is realized. In conjunction with the acquisition of the sample position marks and the precise spatial coordinates (x, y, z) information, the correspondence between the surface space coordinates and the microstructure of the sample is conveniently realized.

Apparatus and method for preparing glow discharge sputtering samples for material microscopic characterization

A camera shooting program control method, the method is applied to terminal equipment, and the method includes obtaining motion parameters collected by at least one motion sensor in response to a situation that the terminal equipment enters a camera shooting program from a screen locking state, and determining a motion state of the terminal equipment according to the motion parameters collected by the at least one motion sensor; obtaining a mistaken touch rate of a display screen of the terminal equipment in response to the motion state of the terminal equipment being a moving state; and exiting the camera shooting program in response to a condition that the mistaken touch rate is greater than a preset first proportion threshold value.

Camera shooting program control method, electronic device, and storage medium

An edge anti-false-touch method is provided. The method includes: obtaining, by a mobile terminal, a face direction of a user of a mobile terminal, and obtaining gesture data of the mobile terminal; determining, by the mobile terminal according to the face direction and the gesture data, a screen display state of the mobile terminal; and adjusting, by the mobile terminal based on the screen display state, a size of an anti-false-touch region of the mobile terminal to trigger an anti-false-touch response of the anti-false-touch region.

Edge anti-false-touch method and apparatus, electronic device and computer-readable storage medium

An apparatus and method for a large-scale high-throughput quantitative characterization and three-dimensional reconstruction of a material structure. The apparatus having a glow discharge sputtering unit, a sample transfer device, a scanning electron microscope unit and a GPU computer workstation. The glow discharge sputtering unit can achieve large size (cm order), nearly flat and fast sample preparation, and controllable achieve layer-by-layer ablation preparation along the depth direction of the sample surface; rapid scanning electron microscopy (SEM) can achieve large-scale and high-throughput acquisition of sample characteristic maps. The sample transfer device is responsible for transferring the sample between the glow discharge sputtering source and the scanning electron microscope in an accurately positioning manner. The GPU computer workstation performs splicing, processing, recognition and quantitative distribution characterization on the acquired sample characteristic maps, and carries out three-dimensional reconstruction of the structure of the sample prepared by layer-by-layer sputtering.

Apparatus and method for large-scale high throughput quantitative characterization and three-dimensional reconstruction of material structure

The invention relates to a full-field statistical & characterizing method of fluid micro-explored strain for alloy microstructure, comprising the following steps: a. grinding and polishing the surface of an alloy sample to mirror with no grinding defects, and then determining a to-be-measured area on the surface of the alloy sample; b. utilizing a white light interferometry 3D surface profiler to perform initial morphology measurement on the surface of an alloy sample; c. utilizing an isostatic pressing technology to obtain the microstructure deformation on the surface of the alloy sample, and then utilizing a white light interferometry 3D surface profiler to perform deformed morphology measurement on the surface of the alloy sample to obtain a changing spectrum of micro morphology of the microstructures on the surface of the alloy; and d. performing trans-scale and rapid quantitative statistical distribution characterization on the morphology change before and after isostatic pressing of the microstructures in the to-be-measured area of the alloy, so as to obtain a corresponding full-field metallography. In the present invention, the sample pretreatment is simple, the analysis speed is rapid, the scanning area is large, and the requirement of high throughput trans-scale analysis can be satisfied, so as to instruct the extraction of the material metallography feature unit.

Full-field statistical and characterizing method of fluid micro-explored strain for alloy microstructure

The present disclosure provides a light-emitting diode (LED) driver circuit and an electronic device. The LED driver circuit includes a rectifier-filter circuit configured to convert an alternating voltage into a direct voltage; a valley-filling circuit connected to the rectifier-filter circuit and configured to adjust a current waveform from the rectifier-filter circuit; a ringing choke converter (RCC) circuit connected to the valley-filling circuit and configured to control a direct current (DC) output; and a DC output unit connected to the RCC circuit and configured to rectify and filter an output signal from the RCC circuit so as to drive an LED load.

LED driver circuit and electronic device

Growing community of inventors

Beijing, China

Xing Yu