Essenlix Corporation

Xing Li

Stephen Y Chou

Wei Ding

Wu Chou

Jun Tian

Mingquan Wu

Yuecheng Zhang

Ji Qi

Hongbing Li

The present disclosure relates to devices, apparatus and methods of improving the accuracy of image-based assay, that uses imaging system having uncertainties or deviations (imperfection) compared with an ideal imaging system. One aspect of the present invention is to add the monitoring marks on the sample holder, with at least one of their geometric and/optical properties of the monitoring marks under predetermined and known, and taking images of the sample with the monitoring marks, and train a machine learning model using the images with the monitoring mark.

Efficient training and accuracy improvement of imaging based assay

The present invention is related to, among other things, the devices and methods that improve the accuracy and reliability of an assay, even when the assay device and/or the operation of the assay device has certain errors, and in some embodiments the errors are random.

Assay detection, accuracy and reliability improvement

A method of assaying an analyte in a sample is disclosed. The method includes having a sample holder with a sample contact area for contacting a sample with an analyte, having a plurality of calibration structures on the sample contact area of the sample holder, imaging a part of the sample contact area that has the calibration structures, and using an algorithm that includes an image, calibration structures in the image, and artificial intelligence and/or machine learning to identify the analyte and/or determine the analyte concentration.

Optics, device, and system for assaying and imaging

One aspect of the present invention is to provide systems and methods that improve the accuracy of an assay that comprise at least one or more parameters each having a random error.

Assay accuracy improvement

The present invention is related to correct the errors in instruments, operation, and others using intelligent monitoring structures and machine learning, and others.

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Metuchen, NJ, United States of America

Xing Li