Adv Antest Corporation

Xin Ping Zeng

Keith Schaub

Liang Ge

Hui Yu

Heng Huat Goh

In a testing device, a method for implementing automatic RF port testing. The method includes attaching a device under test having a plurality of RF pins to a load board, dynamically tuning a plurality of RF ports of the load board to the plurality of RF pins, and automatically matching the plurality of RF ports to the plurality of RF pins with respect to impedance. The method further includes implementing an RF port testing process on the device under test.

Growing community of inventors

San Jose, CA, United States of America

Xin Ping Zeng