Freescale Semiconductor,inc.

University of Connecticut

Xiaoxiao Wang

LeRoy Winemberg

Dat Tat Tran

Anis Mahmoud Jarrar

Nisar Ahmed

Mohammad Tehranipoor

Ender Yilmaz

Orman G Shofner, Jr

Xuehui Zhang

System circuitry includes a logic circuit having an input and an output that is a functional element of the system circuitry. Pattern application circuitry is coupled to the input of the logic circuit and provides an input pattern to the input of the logic circuit. The input pattern has a valid signature based upon a comparison of the input and the output of the logic circuit when the logic circuit is functioning properly. A logic comparator is coupled to the input and the output of the logic circuit and generates pulses in response to the input pattern. A counter is coupled to the logic comparator that obtains a count of the pulses generated by the logic comparator in response to the input pattern. A signature comparator is coupled to the counter and generates a warning signal if the valid signature is different from the count.

Functional path failure monitor

A data processing system on an integrated circuit includes a core that performs switching operations responsive to a system clock that draws current from the power supply network. An IR-drop detector includes a resistor ladder having outputs representative of an IR-drop caused by the core during the switching operations. The system further includes a plurality of amplifiers coupled to the outputs indicative of the IR-drop, a plurality of flip-flops coupled to the amplifiers, and a variable clock generator. The variable clock generator outputs a sampling clock comprising a group consisting of a variable phase or a variable frequency to the plurality of flip-flops. The flip-flops are triggered by the sampling clock so that the IR-drop at a time during a clock cycle of the system clock can be detected, and the peak IR-drop value for can be tracked.

Resolution programmable dynamic IR-drop sensor with peak IR-drop tracking abilities

Aspects of the disclosure relate to combining on-chip structure with external current measurements for threat detection in an integrated circuit. This method considers Trojans' impact on neighboring cells and on the entire IC's power consumption, and effectively localizes the measurement of dynamic power. An on-chip structure can permit threat detections. In one aspect, the on-chip structure can comprise a plurality of sensors distributed across the entirety of the IC, with each sensor of the plurality of sensors being placed in different rows of a standard-cell design. In another aspect, data analysis can permit separating effect of process variations on transient power usage of the IC from effects of a hardware threat such power usage. The on-chip structure also can be employed for implementation of a PE-PUF.

Embedded ring oscillator network for integrated circuit security and threat detection

Growing community of inventors

Austin, TX, United States of America

Xiaoxiao Wang