Fifth Electronics Research Institute of Ministry of Industry and Information Technology

Xiaowen Zhang

Yiqiang Chen

Yunfei En

Yun Huang

Yudong Lu

Faucet

Towel rack

A method for predicting remaining life of electromigration failure is disclosed. The methods includes: establishing an electromigration life model of a MOS device; acquiring a normal electromigration failure lifetime &#x3c4;, based on a current density and a first environment temperature under a preset normal operating condition and the electromigration life model; acquiring a current density stress, based on a target prognostic point &#x3c4;, a second environment temperature and the electromigration life model; inputting the current density stress into a MOS device electromigration failure warning circuit based on a prognostic cell; and if the prognostic circuit of EM failure for a MOS device outputs a high level after a time &#x3c4;, acquiring a remaining life of electromigration failure corresponding to &#x3c4;' based on &#x3c4;, &#x3c4;and &#x3c4;. A device for remaining life prediction for electromigration failure is also disclosed.

Method and device of remaining life prediction for electromigration failure

A method for predicting remaining life of electromigration failure is disclosed. The methods includes: establishing an electromigration life model of a MOS device; acquiring a normal electromigration failure lifetime &#x3c4;1, based on a current density and a first environment temperature under a preset normal operating condition and the electromigration life model; acquiring a current density stress, based on a target prognostic point &#x3c4;2, a second environment temperature and the electromigration life model; inputting the current density stress into a MOS device electromigration failure warning circuit based on a prognostic cell; and if the prognostic circuit of EM failure for a MOS device outputs a high level after a time &#x3c4;3, acquiring a remaining life of electromigration failure corresponding to &#x3c4;2' based on &#x3c4;1, &#x3c4;2 and &#x3c4;3. A device for remaining life prediction for electromigration failure is also disclosed.

Growing community of inventors

Guangdong, China

Xiaowen Zhang