Arm Limited

Tokyo Electron Limited

Xiaoqing Xu

Saurabh Pijuskumar Sinha

Brian Tracy Cline

Lars W Liebmann

Daniel Chanemougame

Jeffrey Smith

Andy Wangkun Chen

Mudit Bhargava

David Victor Pietromonaco

Paul Gutwin

Stephen Lewis Moore

Brian Cline

Yew Keong Chong

Shidhartha Das

Gus Wai-Yan Yeung

Marlin Wayne Frederick, Jr

Sriram Thyagarajan

Paul Christopher De Dood

Daniel J Albers

Tom Shore

Zhiyao Xie

Jerry Chaoyuan Wang

David William Granda

Sheng-En Hung

Chien-Ju Chao

Rahul Mathur

Joel Thornton Irby

Paul T Gutwin

Matthew Paul Elwood

Matthew James Walker

Thanusree Achuthan

Yanbin Jiang

Kumara Guru Palaniswamy

Brian Douglas Ngai Lee

Emmanuel Jean Marie Olivier Pacaud

Matthieu Domonique Henri Pauly

Sylvia Xiuhui Li

Pranavi Chandupatla

Aspects of the present disclosure provide a multi-tier semiconductor structure. For example, the multi-tier semiconductor structure can include a first semiconductor device tier that includes first semiconductor devices. A first signal wiring structure can be formed over and electrically connected to the first semiconductor device tier. An insulator layer can be formed over the first signal wiring structure. A second semiconductor device tier can be formed over the insulator layer, the second semiconductor device tier including second semiconductor devices. A second signal wiring structure can be formed over and electrically connected to the second semiconductor device tier. An inter-tier via can be formed vertically through the insulator layer and electrically connecting the second signal wiring structure to the first signal wiring structure. The first semiconductor device tier, the second semiconductor device tier and the inter-tier via can be formed monolithically.

Inverted top-tier FET for multi-tier gate-on-gate 3-dimension integration (3Di)

A semiconductor device includes a first pair of transistors over a substrate. The first pair of transistors includes a first transistor having a first gate structure over the substrate and a second transistor having a second gate structure stacked over the first transistor. A second pair of transistors is stacked over the first pair of transistors, resulting in a vertical stack perpendicular to a working surface of the substrate. The second pair of transistors includes a third transistor having a third gate structure stacked over the second transistor and a fourth transistor having a fourth gate structure stacked over the third transistor. The third gate structure extends from a central region of the vertical stack to a first side of the vertical stack. The second gate structure and the fourth gate structure extend from the central region to a second side of the vertical stack opposite the first side.

Interdigitated device stack

Aspects of the present disclosure provide a multi-tier semiconductor structure. For example, the multi-tier semiconductor structure can include a lower semiconductor device tier, and a lower signal wiring structure electrically connected to the lower semiconductor device tier. The multi-tier semiconductor structure can further include a primary power delivery network (PDN) structure disposed over the lower semiconductor device tier and the lower signal wiring structure and electrically connected to the lower semiconductor device tier. The multi-tier semiconductor structure can further include an upper semiconductor device tier disposed over and electrically connected the first PDN structure, and an upper signal wiring structure disposed over the primary PDN structure and electrically connected to the upper semiconductor device tier.

Inter-tier power delivery network (PDN) for dense gate-on-gate 3D logic integration

A power meter for measuring power usage in a circuit includes preprocessor and a weighting network. The pre-processor is configured to receive toggle data for a number of power proxy signals in the circuit for a plurality of clock cycles of the circuit in a first time window. The power proxy signals and weighting values are determined automatically from simulated or emulated toggle data. For each power proxy signal, the pre-processor averages the toggle data over one or more clock cycles in one or more second time windows, within the first time window, to provide averaged toggle data, and outputs the averaged toggle data for each second time window. The weighting network is configured to combine the averaged toggle data from the power proxy signals, based on a set of weight values, to provide a measure of the power usage.

Method and apparatus for power measurement in electronic circuit design and analysis

Aspects of the present disclosure provide a multi-tier semiconductor structure. For example, the multi-tier semiconductor structure can include a first power delivery network (PDN) structure, and a first semiconductor device tier disposed over and electrically connected to the first PDN structure. The multi-tier semiconductor structure can further include a signal wiring tier disposed over and electrically connected to the first semiconductor device tier, a second semiconductor device tier disposed over and electrically connected to the signal wiring tier, and a second PDN structure disposed over and electrically connected to the second semiconductor device tier. The multi-tier semiconductor structure can further include a through-silicon via (TSV) structure electrically connected to the signal wiring tier, wherein the TSV structure penetrates the second PDN structure.

Multi-tier backside power delivery network for dense gate-on-gate 3D logic

An integrated circuit includes a first circuit and a power meter coupled to the first circuit at selected proxy locations. The power meter includes circuitry for generating toggle data, such as signal transitions or signal levels, from signals at the proxy locations and combiner circuitry for combining the toggle data in a first time window with a set of weight value to produce a measure of power usage in the first circuit. The proxy locations and weight values are selected automatically based on simulated or emulated signals from a larger set of locations in the first circuit and associated power usage in the first circuit.

Method and apparatus for on-chip power metering using automated selection of signal power proxies

According to one implementation of the present disclosure, an integrated circuit includes a memory macro unit, and one or more through silicon vias (TSVs) at least partially coupled through the memory macro unit. According to one implementation of the present disclosure, a computer-readable storage medium comprising instructions that, when executed by a processor, cause the processor to perform operations including: receiving a user input corresponding to dimensions of respective pitches of one or more through silicon vias (TSVs); determining whether dimensions of a memory macro unit is greater than a size threshold, wherein the size threshold corresponds to the received user input; and determining one or more through silicon via (TSV) positionings based on the determined dimensions of the memory macro unit.

TSV coupled integrated circuits and methods

According to one implementation of the present disclosure, a method includes: generating a three-dimensional (3D) circuit design of an integrated circuit; and providing respective inter-tier connections coupling for first and second networks concurrently on the generated 3D circuit design. The first networks may include power or ground networks, while the second networks may include signal networks. In another implementation, a method includes: generating a three-dimensional (3D) circuit design of an integrated circuit; and providing inter-tier connections on the generated 3D circuit design during one of a placement stage, a partitioning stage, a clock tree synthesis (CTS) stage, or a routing stage of a physical circuit design procedure.

Methods and apparatuses for concurrent coupling of inter-tier connections

Various implementations described herein are directed to an integrated circuit (IC) having a design that is severable into multiple sub-circuits having input-output (IO) ports. The integrated circuit (IC) may include multiple physical electrical connections that are adapted to electrically interconnect the IO ports of the multiple sub-circuits to operate as the IC, and the IO ports have three-dimensional (3D) geometric position information associated therewith.

Dielet design techniques

Disclosed are methods, systems and devices for distribution of a timing signal among operational nodes of a circuit device comprising one or more circuit dies. In one implementation, a timing signal distribution network may transmit a timing signal to one or more operational circuit nodes formed on a circuit die and a clock circuit may generate a first clock signal for transmission as the timing signal to the one or more operational circuit nodes. A switch circuit may apply a second clock signal for transmission as the timing signal in lieu of the first clock signal if the circuit die is integrated at least one of the one or more other circuit dies. In another implementation, timing signals received at timing signal terminals of at least two of two or more of operational circuit nodes may be synchronized independently of the timing signal distribution network.

Method, system and circuit for multi-die timing signal distribution

Various implementations described herein are directed to a method that defines tiers of an integrated circuit having standard cells placed adjacent to each other in a multi-tier placement. The integrated circuit includes multi-tier nets connected with inter-tier connections. The method includes pairing inter-tier connections as inter-tier-connection pairs belonging to a same net. The method includes grouping standard cells in groups with or without inter-tier-connection pairs from the tiers. The method includes relating the standard cells with or without inter-tier-connection pairs within each group from the groups by generating a multi-tier fence boundary around physical locations of the standard cells with or without inter-tier-connection pairs. The method includes iteratively adjusting a location of the standard cells with or without a location of inter-tier connections so as to converge the location of the standard cells with or without the location of the inter-tier connections to optimized locations or legal locations.

Multi-tier co-placement for integrated circuitry

A multi-die integrated circuit with improved testability can include at least two dies that combined comprise an integrated circuit for a self-contained system, which includes logic and design-for-test features. The integrated circuit is split into at least two portions, where each portion is disposed on a corresponding one of the at least two dies. As part of the improved testability for both pre-bond testing of logic and post-bond testing of inter-die connections, at least one of the at least two dies further comprises a split-circuit-boundary scan chain. An automated design tool can be used to determine optimal ways for the integrated circuit for a self-contained system to be split into at least two portions for the corresponding at least two dies. In addition, a split-circuit-boundary scan chain option can be applied for each portion, via the automated design tool, to ensure boundary scans are available on timing paths.

Multi-die integrated circuits with improved testability

A computer implemented system and method is provided for generating a layout of the cell defining a circuit component, the layout providing a layout pattern for a target process technology. The method comprises obtaining an archetype layout providing a valid layout pattern for the cell having regard to design rules of the target process technology, and receiving an input data file providing a process technology independent schematic of the circuit component for which the cell is to be generated. A schematic sizing operation is then performed on the input data file, having regard to both schematic constraints applicable to the target process technology and layout constraints derived from the archetype layout, in order to generate an output data file providing a process technology dependent schematic of the circuit component. A cell generation operation is then performed using the output data file and layout data determined from the archetype layout in order to generate the layout of the cell. Such an approach enables both the schematic and layout to be co-optimised during generation of the layout of the cell.

Computer implemented system and method for generating a layout of a cell defining a circuit component

Various implementations described herein are directed to a method that defines tiers of an integrated circuit having standard cells placed adjacent to each other in a multi-tier placement. The integrated circuit includes multi-tier nets connected with inter-tier connections. The method includes pairing inter-tier connections as inter-tier-connection pairs belonging to a same net. The method includes grouping standard cells in groups with or without the inter-tier-connection pairs from the tiers. The method includes relating the standard cells with or without the inter-tier-connection pairs within each group from the groups by generating a multi-tier fence boundary around physical locations of the standard cells with or without the inter-tier-connection pairs. The method includes iteratively adjusting a location of the standard cells with or without a location of inter-tier connections so as to converge the location of the standard cells with or without the location of the inter-tier connections to optimized or legal locations.

A computer implemented system and method is provided for generating a layout of the cell defining a circuit component, the layout providing a layout pattern for a target process technology. The method comprises obtaining an archetype layout providing a valid layout pattern for the cell having regard to design rules of the target process technology, and receiving an input data file providing a process technology independent schematic of the circuit component for which the cell is to be generated. A schematic sizing operation is then performed on the input data file, having regard to both schematic constraints applicable to the target process technology and layout constraints derived from the archetype layout, in order to generate an output data file providing a process technology dependent schematic of the circuit component. A cell generation operation is then performed using the output data file and layout data determined from the archetype layout in order to generate the layout of the cell. Such an approach enables both the schematic and layout to be co-optimized during generation of the layout of the cell.

Growing community of inventors

Austin, TX, United States of America

Xiaoqing Xu