Hermes Microvision Inc.

Beijing Geekplus Technology Co. Ltd.

Xiaoli Guo

Weiming Ren

Zhongwei Chen

Xuedong Liu

Feng Cao

Wei He

Yan Ren

Jack Jau

Yixiang Wang

Joe Wang

Chiyan Kuan

Juying Dou

Chao Chen

Qingpo Xi

Fumin He

Yingchun Wang

Ningning Yang

The present disclosure provides a pickup robot, a pickup method, and a computer-readable storage medium. First, obtain a target image captured when a pickup component moves to each slot where a commodity is stored; then, when it is determined, on the basis of the slot identifier in the target image, that the current slot is a target slot which stores a commodity to be picked, screen a commodity identifier from the target image; when the commodity identifier is obtained by means of screening, determine, on the basis of the commodity identifier, the position information of the commodity to be picked up in the target slot; finally, pick up, on the basis of the position information, said commodity from the target slot. In the technical solution above, the target slot where the commodity to be picked up is stored, and the position information of said commodity in the target slot can be accurately determined by using the slot identifier and the commodity identifier, and said commodity can be accurately picked up on the basis of the determined position information, thereby effectively improving the pickup success rate, and also helping to improve the logistics efficiency of logistics industry.

Pickup robot, pickup method, and computer-readable storage medium

An intelligent forklift and a method for detecting a pose deviation of a container are provided. The intelligent forklift includes a working state monitor, an image sensor, and a processor. The working state monitor is configured to monitor a working state of the intelligent forklift while the intelligent forklift is carrying and moving a stock container and send a trigger to the image sensor based on the working state. The image sensor is configured to capture an RGBD image frame containing the stock container in response to the trigger and to transmit the RGBD image frame to the processor. The processor is configured to receive the RGBD image frame, detect a pose deviation degree of the stock container and provide an alarm and/or a prompt based on a detection result of the pose deviation degree for adjusting the pose of the stock container.

Intelligent forklift and method for detecting pose deviation of container

The present invention provides a dual-beam apparatus which employs the dark-field e-beam inspection method to inspect small particles on a surface of a sample such as wafer and mask with high throughput. The dual beam apparatus comprises two single-beam dark-field units placed in a same vacuum chamber and in two different orientations. The two single-beam dark-field units can perform the particle inspection separately or almost simultaneously by means of the alternately-scanning way. The invention also proposes a triple-beam apparatus for both inspecting and reviewing particles on a sample surface within the same vacuum chamber. The triple-beam apparatus comprises one foregoing dual-beam apparatus performing the particle inspection and one high-resolution SEM performing the particle review.

Charged particle beam apparatus

The present invention provides a charged particle beam apparatus which employs LVSEM to inspect sample surface with a throughput much higher than the prior art. The high throughput is realized by providing a probe current and a FOV both several times of those of the prior art. Accordingly several means are proposed to avoid obvious degradation of image resolution due to the increases in Coulomb effect and geometric aberrations, and increase efficiency and uniformity of secondary charged particle collection.

The present invention relates to a charged particle beam apparatus which employs a scanning electron microscope for sample inspection and defect review. The present invent provides solution of improving imaging resolution by utilizing a field emission cathode tip with a large tip radius, applying a large accelerating voltage across ground potential between the cathode and anode, positioning the beam limit aperture before condenser lens, utilizing condenser lens excitation current to optimize image resolution, applying a high tube bias to shorten electron travel time, adopting and modifying SORIL objective lens to ameliorate aberration at large field of view and under electric drifting and reduce the urgency of water cooling objective lens while operating material analysis. The present invent provides solution of improving throughput by utilizing fast scanning ability of SORIL and providing a large voltage difference between sample and detectors.

Electron beam apparatus

Growing community of inventors

Beijing, China

Xiaoli Guo