Beijing University of Technology

Boe Technology Group Co., Ltd.

Beijing Boe Optoelectronics Technology Co., Ltd.

China Academy of Space Technology

Xiaodong Han

Ze Zhang

Xiaodong Wang

Pan Liu

Jianfei Zhang

Zhipeng Li

Yadi Zhai

Taonan Zhang

Yonghai Yue

Yan Ma

Dongfeng Ma

Qingsong Deng

Mao Shengcheng

Xiaochen Li

Yuefei Zhang

Lihua Wang

Qi Zhang

Qiang Wei

Kun Zheng

Dongwei Li

Baoxiang Sun

Jianhe Li

Shengcheng Mao

Chunqiang Zhuang

Guixing Cao

Shibiao Zeng

Tingrong Guo

Zhenjiang Cui

Jianjun Gong

Zhicheng Zhou

The present disclosure provides a device and method for measuring a correlation between fatigue performance and a microstructure of a one-dimensional (1D) nanomaterial in situ in a transmission electron microscope (TEM), belongs to the technical field of in-situ testing and characterization of microstructures of nanomaterials. The device includes a chip part, a supporting part, and a control circuit. The supporting part is a bracket and a cable disposed on a transmission sample holder, and the circuit part consists of cables connected to the chip and a power supply capable of applying different waveforms, variable voltages, and variable frequencies. This design breaks through a traditional mechanical stress-driven fatigue performance test method, and achieves controllable adjustment of different amplitudes and cycles by using an electric field formed by a voltage and adjusting a voltage size and frequency, such that the 1D nanomaterial vibrates in the electric field to achieve fatigue performance testing.

Device and method for measuring correlation between fatigue performance and microstructure of one-dimensional (1D) nanomaterial in situ in transmission electron microscope (TEM)

A method utilizing cold welding to prepare grain boundaries having different included angles includes using a device including a support member. Two bent members are arranged opposite to each other in the support member. One ends of the two bent members are both fixedly connected to the support member, one end, away from the support member, of any bent member is fixedly connected to a first sample, one end, away from the support member, of the other bent member is fixedly connected to a second sample, and the first sample and the second sample are arranged corresponding to each other. The bent member includes a first metal sheet and a second metal sheet having different thermal expansion coefficients. An angle between the first sample and the second sample during butt welding can be controlled by changing an included angle of a bimetallic sheet.

Method utilizing cold welding to prepare grain boundaries having different included angles

A polarizer includes a light uniformizing structure. The light uniformizing structure includes a light-diffusion particle layer. The light-diffusion particle layer is configured to improve uniformity of light rays passing through the polarizer.

Polarizer and display device

A menu-type design method based on optimized information fusion applied to a GEO satellite control system is provided, which includes: configuring four long-life inertial attitude sensor gyroscopes for a long-life GEO satellite control system; configuring sensors capable of measuring three-axis attitude according to a menu-type design requirement on hardware, where the long-life inertial attitude sensor gyroscopes and the sensors capable of measuring three-axis attitude are combined to form three types of Kalman filters; autonomously sorting, by the satellite-borne computer application software, the Kalman filters; and in a case where an FDIR module detects a fault, autonomously generating, by the FDIR module, an alarm corresponding to the fault, and autonomously performing, by a currently selected Kalman filter, reduced-order filtering, and in a case where the fault is not eliminated within a set time period, issuing, by the FDIR module, a macro instruction sequence to perform autonomous reorganization.

Menu-type design method for GEO satellite control system based on optimized information integration

A double-tilt in-situ nanoindentation platform for TEM (transmission electron microscope) belongs to the field of in-situ characterization of the mechanical property-microstructure relationship of materials at the nano- and atomic scale. The platform is consisted of adhesive area, support beams, bearing beams, sample loading stage and mini indenter. The overall structure of the platform is prepared by semiconductor microfabrication technology. The in-situ nanoindentation experiment can be driven by bimetallic strip, V-shaped electro-thermal beam, piezoelectric ceramics, electrostatic comb or shape memory alloys et. al. The sample is obtained by focused ion beam cutting. The integrated platform can be placed in the narrow space on the front end of the TEM sample holder, giving rise to the condition of double-axis tilt. The driving device drives the mini indenter to carry out in-situ nanoindentation, in-situ compression and in-situ bending and the like of the materials in TEM. The deformation process of material can be in-situ observed in sub angstrom, atomic and nano scale to study the deformation mechanism of material, which can further reveal the relationship of microstructure-mechanical properties of the material.

Double-tilt in-situ nanoindentation platform for transmission electron microscope

A double-tilt in-situ mechanical sample holder for TEM based on piezoelectric ceramic drive belongs to the field of material microstructure-mechanical properties in-situ characterization, and it comprise two parts of sample holder shaft body and piezoelectric ceramic drive system. The sample holder shaft body comprise tilt stage, sample holder, linear stepping motor, drive rod, drive linkage. The piezoelectric ceramic drive system comprise piezoelectric ceramic loading stage, piezoelectric ceramic, connecting base and the sample loading stage realizing stretch or compression function. The double-axis tilt of the samples in X and Y axis directions is realized by the reciprocating motion back and forth of the drive rod driven by the linear stepping motor. The stretch or compression of the samples is realized by applying voltage on the piezoelectric ceramic to generate displacement and push the sample loading stage by the connecting base. The invention coordinating with high resolution TEM realizes the observation of the microstructure in atomic and even sub angstrom scales, and at the same time it ensures the controllable deformation of nanomaterials, further realizes the integrative research on the material microstructure-mechanical properties and reveals the deformation mechanism of the materials.

Double-tilt in-situ mechanical sample holder for TEM based on piezoelectric ceramic drive

A double-tilt sample holder for TEM, comprising: it comprise the main body of sample holder body, front-end tilt stage, drive rod, linkage, tilt axis, rotation axis, fixed axis of drive rod and sample loading stage. The axis hole is arranged at the front-end tilt stage, which is connected to the main body of the sample holder body by the tilt axis. The linkage, the boss slot and the drive rod slot are connected by the rotation axis. Two through movement guide grooves are designed symmetrically at both sides of the front-end of sample holder body, and the drive rod is fixed by the fixed axis of the drive rod, which restricts the drive rod to move reciprocally in a straight line driven by the linear stepping motor at the back-end of the main body of the holder body, further leading the tilt stage to rotate around the tilt axis. The tilt angle of the sample loading stage can be precisely controlled by the high precision linear stepping motor in the apparatus. The maximum tilt angle of the sample stage can be adjusted by the included angle between the boss at the bottom surface of the front-end tilt stage and the horizontal direction and the length of the movement guide groove in the apparatus. The apparatus can be used coordinately with TEM and its universality is wide.

Double-tilt sample holder for transmission electron microscope

A double tilt sample holder for in-situ measuring mechanical and electrical properties of microstructures in transmission electron microscope (TEM) is provided. The sample holder includes a home-made hollow sample holder body, a sensor for measuring mechanical/electrical properties, a pressing piece, a sample holder head, a sensor carrier. The sensor for measuring mechanical/electrical properties is fixed on the sensor carrier on the sample holder head by the pressing piece, while the sensor carrier is connected to the sample holder head through a pair of supporting shafts located on sides of the sample holder head. The sensor carrier can tilt within the plane perpendicular to the ample holder head by revolving around the supporting shafts (i.e. tilting along Y axis at an angle of &#xb1;30&#xb0;). The sample holder also allows obtaining mechanical/electrical parameters concurrently.

Double tilt transmission electron microscope sample holder for in-situ measurement of microstructures

A sensor for quantitative testing electromechanical properties and microstructure of nano-materials and a manufacturing method for the sensor are provided. The sensor comprises a suspended structure, pressure-sensitive resistor cantilevers, support beams, bimetallic strip and other components. When the bimetallic strip produces bending deformation, one of the pressure-sensitive resistor cantilevers is actuated and then stretches the low-dimensional nano-materials which drive the other pressure-sensitive resistor cantilever to bend. Through signal changes are outputted by the Wheatstone bridge, the variable stresses of low-dimensional nano-materials are obtained. Meanwhile, the variable strains of low-dimensional nano-materials are obtained by the horizontal displacements between two cantilevers, so the stress-strain curves of low-dimensional nano-materials are worked out. When the low-dimensional nano-materials are measured in the power state, the voltage-current curves are also obtained. In addition, by the help of high resolution imaging system in the transmission electron microscopy, the mechanical-electrical-microstructure relationship of the nano-materials can be recorded in situ and in atomic lattice resolution.

Sensor for quantitative measurement of electromechanical properties and microstructure of nano-materials and method for making the same

A device for measuring electromechanical properties and microstructure of nano-materials under stress state comprises two bimetallic strips placed on an insulated metal ring plated with insulating paint, wherein the two bimetallic strips are placed in parallel or V-shaped to insulated metal ring on the same plane, one end of each bimetallic strip is fixed on the insulated metal ring, the other end of the bimetallic strip hangs inside of the insulated ring, the distance of two bimetallic strips were controlled within 0.002-1 mm. Also provided is a method for measuring electromechanical properties and microstructure of nano-materials under stress state.

Device and method for measuring electromechanical properties and microstructure of nano-materials under stress state

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Beijing, China

Xiaodong Han