Carl Zeiss X-ray Microscopy, Inc.

Xiaochao Xu

Christoph Hilmar Graf Vom Hagen

Christoph Graf Vom Hagen

A detection system for an x-ray or charged particle imaging system utilizes high bandgap, direct conversion x-ray detection materials. The signal of the x-ray/charged particle projection is recorded in a spatial light modulator such as a liquid crystal (LC) light valve. The light valve is then read-out by a polarized light optical microscope and a high speed camera. The camera is used to track the blooming spots in the light valve to resolve their intensity, and relate that intensity of the input x-ray photon or charged particle. This allows of spatially resolved, imaging, x-ray and/or charged particle spectrometer.

Spectrally and spatially resolved x-ray and particle detection system

A detection system for an x-ray microscopy system utilizes high bandgap, direct conversion x-ray detection materials. The signal of the x-ray projection is recorded in a spatial light modulator such as a liquid crystal (LC) light valve. The light valve is then read-out by a polarized light optical microscope. This configuration will mitigate the loss of light in the optical system over the current scintillator-optical microscope-camera detection systems.

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Pleasanton, CA, United States of America

Xiaochao Xu