Applied Materials, Inc.

Xiangdong He

Jay Thomas Scheuer

Robert C Lindberg

George Gammel

Shardul Patel

Eric D Wilson

Tyler Wills

Provided herein are approaches for optimizing a full horizontal scanned beam distance of an accelerator beam. In one approach, a method may include positioning a first Faraday cup along a first side of an intended beam-scan area, positioning a second Faraday cup along a second side of the intended beam-scan area, scanning an ion beam along the first and second sides of the intended beam-scan area, measuring a first beam current of the ion beam at the first Faraday cup and measuring a second beam current of the ion beam at the second Faraday cup, and determining an optimal scan distance of the ion beam across the intended beam-scan area based on the first beam current and the second beam current.

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Westborough, MA, United States of America

Xiangdong He