Uchicago Argonne, LLC

Xianbo Shi

Lahsen Assoufid

Deming Shu

Steven P Kearney

Jayson W Anton

Jonathan Z Tischler

Michael J Wojcik

Hawoong Hong

Zhi Qiao

Ross J Harder

Tim M Mooney

The present disclosure relates to a flexure mechanism that includes a plurality of thin material structures, each thin material structure including a weak-link portion and a separable constraint portion. The separable constraint portion is linked to the weak-link portion and configured to stabilize the weak-link portion. Additionally, the plurality of thin material structures are stacked and secured together to form a laminar structure.

Constrained flexure mechanism and method for manufacturing the same

Phase contrast and dark-field X-ray imaging enable imaging of objects that absorb or reflect very little X-ray light. Disclosed is a method and systems for performing coded-mask-based multi-contrast imaging (CMMI). The method includes providing radiation to a coded mask that has a known phase and absorption profile according to a pre-determined pattern. The radiation is then impingent upon a sample, and the radiation is detected to perform phase-reconstruction and image processing. The method and associated systems allow for the use of maximum-likelihood and machine learning methods for reconstruction images of the sample from the detected radiation.

Coded-mask-based X-ray phase-contrast and dark-field imaging

Monochromators selectively transmit a narrow band of wavelengths of radiation from a broader band of wavelengths for use in a variety of applications and industries. Disclosed is a method and system for fixed-exit angle tunable monochromator. The system includes a first diffraction element configured to reflect an input beam incident on a surface of the first diffraction element. The input beam has an input beam vector and the first diffraction element is rotatable about the input beam vector. The system further includes a second diffraction element configured to reflect the beam as an output beam having a fixed beam exit angle. The beam is incident on a surface of the second diffraction element and the reflected beam has a reflected beam vector. The second diffraction element is rotatable about both the input beam vector and the reflected beam vector.

Tunable side-bounce x-ray monochromator

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Naperville, IL, United States of America

Xianbo Shi