Freescale Semiconductor,inc.

Xavier Hue

Lionel Mongin

Jacques Trichet

Francois Dupis

A test unit for testing the frequency characteristics of one or more components of a transmitter of modulated signals. The test unit includes a data source for generating a test pattern of data. A test unit output is connected to the data source and connectable to an input of one or more of the components, for inputting the test pattern of data to the one or more components. The test unit includes a memory in which a first predetermined data sequence and a second predetermined data sequence are stored. The data source is connected with an data input to the memory, and the data source is arranged to generating the test pattern of data including the predetermined data sequences. When a modulated signal is generated in accordance with the test pattern of data will include a first signal part with a first frequency spectrum caused by the first predetermined data sequence and a second signal part after the first signal part, which second signal part has a second frequency spectrum caused by the second predetermined data sequence.

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Cugnaux, France

Xavier Hue