Schlumberger Technologies, Inc.

Xavier A Flinois

Stefano E Concina

The present invention provides methods and apparatus for rapid compression of images composed of pixels into high-resolutions, compressed icon images, and for dynamic fault imaging of operating faults in integrated circuit devices employing such methods. Displaying a plurality of such icons juxtaposed on a screen permits ready tracing of a fault in an IC device under test, even by persons having little knowledge of the functionality of the devices. In accordance with the invention, an image made up of n.times.n pixels may be compressed into an icon of p.times.p pixels, where n.dbd.P.multidot.q and q is an integer, by dividing the image into p tiles of q.times.q pixels, selecting q pixels from each tile, where each of said selected q pixels is representative of predetermined directional orientations within the tile, and calculating the mean value of the selected q pixels, to produce a single pixel representative of the tile. The pixels representative of said tiles thus form an icon of p.times.p pixels. Each of the selected q pixels is preferably uniquely representative of a horizontal row of q pixels, a vertical column of q pixels, and a pair of mutually-orthogonal diagonal lines of pixels of the tile. Edge enhancement may also be performed to sharpen the features of the resulting icon. The invention further includes a method of dynamic imaging of operating faults in integrated circuit devices. The methods are preferably carried out in the general purpose processor of an engineering workstation, which may be associated with an electron beam test probe for acquisition of the images.

High resolution image compression methods and apparatus

Methods and apparatus are disclosed for rapid and interactive 'warping' of a first image made up of pixels to form a resulting image made up of pixels which are aligned, pixel-for-pixel, with a second image made up of pixels. The images may be stroboscopic voltage contrast images representing operating states of two integrated circuit devices--a failing device and a fully functional device. The aligned images permit an engineer who may have little knowledge of the device to diagnose dynamic failures of the failing device by comparing the aligned images to produce an image showing the differences.

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Mountain View, CA, United States of America

Xavier A Flinois