Fei Comapny

Xaver Voegele

Rainer Daum

Rainer Uhl

A standing wave interferometric microscope is disclosed herein. An example microscope may include an illuminator, for illuminating a specimen with a standing wave of input radiation at an analysis location to cause the specimen to fluoresce, the specimen arranged in the analysis location, a pair of projection systems, arranged at opposite sides of the analysis location, coupled to collect at least a portion of the fluorescence and direct a corresponding pair of fluorescence light beams into a respective pair of inputs of an optical combining element, a wavefront modifier for producing astigmatism in at least one of the fluorescence light beams entering the optical combining element, and a detector for examining output light from said combining element.

Standing wave interferometric microscope

A wide-field interferometric microscope comprising:

The invention relates to a microscope arrangement provided with: a microscope () having at least two optical outputs () for outputting a fluorescence signal and a switching arrangement () for switching the output of the fluorescence signal between the optical outputs; a beam splitter arrangement (); optical elements () for generating a separate partial beam path () associated with each output in such a way that the respective fluorescence signal of each of the outputs is superimposed at the beam splitter arrangement after passing through the respective partial beam path; and also at least two optical detectors (), wherein for each of the partial beam paths, one of the detectors is located behind the beam splitter, seen from the microscope, in reflection and another of the detectors is located behind the beam splitter arrangement, seen from the microscope, in transmission.

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Munich, Germany

Xaver Voegele