Samsung Electronics Co., Ltd.

Woong-dai Kang

Hyun-chul Yoon

Young-Ho Kim

Young-Ju Kim

Soo-Young Kim

Kyung-Ryun Kim

Hyuk-Joon Kwon

Bok-Yeon Won

Su-a Kim

Sang-Keun Han

Jin-yong Choi

Ji-Suk Kwon

Bum-Jae Lee

Min-Woo Won

Ji-Hak Yu

Seok-Jae Lee

A memory device including a memory cell array connected to a first bit line, first word lines, and second word lines, the memory cell array including a first memory cell and a second memory cell, the first memory cell being connected between the first word lines and the first bit line, and the second memory cell being connected between the second word line and the first bit line; a first word line driver configured to drive the first word lines; a second word line driver configured to drive the second word lines; and a test manager configured to drive second word lines to change a capacitance of the first bit line, and after the capacitance of the first bit line is changed, drive first word lines to test the first word lines.

Memory device performing test on memory cell array and method of operating the same

A memory device including a memory cell array region, includes, column selection signal lines formed in a first column conduction layer of the memory cell array region and extending in a column direction, global input-output data lines formed in a second column conduction layer of the memory cell array region different from the first column conduction layer and extending in the column direction and power lines formed in a shield conduction layer of the memory cell array region between the first column conduction layer and the second column conduction layer. The noises in the signal lines and the power lines may be reduced and performance of the memory device may be enhanced by forming the column selection signal lines and the global input-output data lines in different column conduction layers and forming the power lines in the shield conduction layer between the column conduction layers.

Memory device and method of disposing conduction lines of the same

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Seongnam-si, South Korea

Woong-dai Kang