Xilinx, Inc.

Woon Wong

Brendan Farley

John G O'Dwyer

Paul Newson

John E McGrath

John Edward Mcgrath

Bruno Miguel Vaz

Conrado K Mesadri

Ali Boumaalif

Christophe Erdmann

Christopher Erdman

An example programmable device includes a configuration memory configured to store configuration data; a programmable logic having a configurable functionality based on the configuration data in the configuration memory; a signal conversion circuit; a digital processing circuit; an endpoint circuit coupled to the signal conversion circuit through the digital processing circuit; wherein the digital processing circuit includes a first one or more digital processing functions implemented as hardened circuits each having a predetermined functionality, and a second one or more processing functions implemented by the configurable functionality of the programmable logic.

Programmable device having hardened circuits for predetermined digital signal processing functionality

An integrated circuit is described. The integrated circuit comprises an analog-to-digital converter circuit configured to receive an input signal at an input and generate an output signal at an output; and a monitor circuit coupled to the output of the analog-to-digital converter circuit, the monitor circuit configured to receive the output signal and to generate integration coefficients for the analog-to-digital converter circuit; wherein the integration coefficients are dynamically generated based upon signal characteristics of the output signal generated by the analog-to-digital converter circuit. A method of receiving data in an integrated circuit is also described.

Circuit for and method of receiving data in an integrated circuit

An integrated circuit is described. The integrated circuit comprises a first portion having programmable resources; a second portion having hardened circuits including an analog-to-digital converter circuit configured to receive an input signal and generate an output signal; and a monitor circuit configured to receive an output signal generated by the analog-to-digital converter circuit; wherein the monitor circuit is configurable to control a calibration of the analog-to-digital converter circuit based upon signal characteristics of the output signal generated by the analog-to-digital converter circuit. A method of receiving data in an integrated circuit is also described.

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Dublin, CA, United States of America

Woon Wong