Skhynix Inc.

Unitest Inc.

Woo Sik Jung

Sang Ah Hyun

Hyo Jin Oh

Jun Phyo Lee

Yong Ho Seo

Dae Kyoung Kim

Bong Hwa Jeong

Jin Young Jung

Byoung Seon Koh

Young Bae Choi

A test system includes a test device configured to output a command address and a test dock for performing a test mode and to receive a comparison signal, and a memory device configured to enter the test mode, based on the command address, to set an initial value by the command address, to perform a calculation operation on the initial value according to a logic level combination of the command address to generate a row address and a command address during a pre-charge operation, and to compress and compare internal data output based on the row address and the column address to output the internal data as the comparison signal to the test device.

Test systems configured to perform test mode operations for multiple memory devices

A test board unit may include a test board, a thermal tank and a heat-dissipating plate. The test board may be configured to provide a semiconductor chip with a test current. The thermal tank may be configured to dissipate heat generated in the semiconductor chip. The heat-dissipating plate may be coupled between the test board and the thermal tank and may be configured to transfer the heat from the semiconductor chip to the thermal tank.

Test board unit and apparatus for testing a semiconductor chip including the same

A burn-in test system may include a burn-in test chamber, a heating chamber and a cooling chamber. The burn-in test chamber may receive an object thereon. The burn-in test chamber may perform a burn-in test at a burn-in test temperature. The heating chamber may be positioned at a first sidewall of the burn-in test chamber, and may preheat the object. The cooling chamber may be positioned at a second sidewall of the burn-in test chamber, and may cool the object.

Burn-in test system and method

Growing community of inventors

Icheon-si, South Korea

Woo Sik Jung