Growing community of inventors

Seoul, South Korea

Woo-Jin Jang

Average Co-Inventor Count = 4.68

ph-index = 3

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 22

Woo-Jin JangHong-Jae Shin (3 patents)Woo-Jin JangTien-Jen Cheng (2 patents)Woo-Jin JangHyeok-Sang Oh (2 patents)Woo-Jin JangBum-Ki Moon (2 patents)Woo-Jin JangMinseok Oh (2 patents)Woo-Jin JangJi-Hong Choi (2 patents)Woo-Jin JangYoung-Ho Kim (1 patent)Woo-Jin JangHun Rae Kim (1 patent)Woo-Jin JangKyoung-woo Lee (1 patent)Woo-Jin JangSeung-Il Bok (1 patent)Woo-Jin JangSae-Il Son (1 patent)Woo-Jin JangHyo-Jeong Moon (1 patent)Woo-Jin JangWoo-Choel Noh (1 patent)Woo-Jin JangDong-Whan Ko (1 patent)Woo-Jin JangHyung-keun Park (1 patent)Woo-Jin JangTae-sung Moon (1 patent)Woo-Jin JangWoo-Jin Jang (6 patents)Hong-Jae ShinHong-Jae Shin (55 patents)Tien-Jen ChengTien-Jen Cheng (33 patents)Hyeok-Sang OhHyeok-Sang Oh (11 patents)Bum-Ki MoonBum-Ki Moon (8 patents)Minseok OhMinseok Oh (5 patents)Ji-Hong ChoiJi-Hong Choi (2 patents)Young-Ho KimYoung-Ho Kim (115 patents)Hun Rae KimHun Rae Kim (65 patents)Kyoung-woo LeeKyoung-woo Lee (43 patents)Seung-Il BokSeung-Il Bok (2 patents)Sae-Il SonSae-Il Son (2 patents)Hyo-Jeong MoonHyo-Jeong Moon (1 patent)Woo-Choel NohWoo-Choel Noh (1 patent)Dong-Whan KoDong-Whan Ko (1 patent)Hyung-keun ParkHyung-keun Park (1 patent)Tae-sung MoonTae-sung Moon (1 patent)
..
Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. Samsung Electronics Co., Ltd. (6 from 131,214 patents)

2. International Business Machines Corporation (1 from 164,108 patents)

3. Infineon Technologies Ag (1 from 14,705 patents)

4. Advanced Micro Devices Corporation (1 from 12,867 patents)


6 patents:

1. 9281240 - Methods of manufacturing semiconductor devices

2. 8993436 - Method for fabricating semiconductor device that includes forming passivation film along side wall of via hole

3. 8697455 - Monitoring test element groups (TEGs) for etching process and methods of manufacturing a semiconductor device using the same

4. 8373273 - Methods of forming integrated circuit devices having damascene interconnects therein with metal diffusion barrier layers and devices formed thereby

5. 8232200 - Methods of forming integrated circuit devices having damascene interconnects therein with metal diffusion barrier layers and devices formed thereby

6. 7282801 - Microelectronic device chip including hybrid Au bump, package of the same, LCD apparatus including microelectronic device chip and method of fabricating microelectronic device chip

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as of
12/3/2025
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