Samsung Electronics Co., Ltd.

Woo-Il Kim

Jeong-Ho Bang

Hyun-Seop Shim

Hyoung-Young Lee

Ki-Bong Ju

Young-Ki Kwak

Embodiments of the invention connect a plurality of devices under test (DUTS) in a parallel manner and a high test current is selectively applied to each DUT. The apparatus to test a plurality of DUTs includes a plurality of power sources providing the test current to a plurality of DUTs; and switching devices connected to the respective DUTs and power sources and selectively providing the test current. In addition, the apparatus has at least one control unit to control the switching devices. Furthermore, a group of DUTs from the plurality of DUTs is connected between two of the plurality of power sources in a parallel manner, and the test current is selectively provided to one DUT from the group of DUTs according to the operation of the switching devices.

Growing community of inventors

Chungcheongnam-do, South Korea

Woo-Il Kim