Asti Corporation

Microview Technologies Pte Ltd

Wong Soon Wei

Victor Vertoprakhov

Noor Ashedah Binti Jusoh

Sreenivas Rao

Tan Seow Hoon

Sergey Smorgon

Satish Kaveti

A method of inspecting two or more sides of an object is provided. The method includes generating one set of image data of two or more sides of the object, such as by using spherical mirror segments that project all sides of the object onto a single image and generating an X by Y array of image data of the single image. The projection of the image data is then compensated for, such as by identifying inspection processes to locate defects of the object in the projected image data or by converting the image data from the projected inspection coordinates to Cartesian coordinates. Predetermined inspection processes are then performed on the compensated image data, such as by using the inspection processes that are optimized for use with the projected image data or by converting the projected image data into a Cartesian format and using Cartesian image data inspection processes.

Peripheral inspection system and method

A system for inspecting a component is provided. The system includes an imaging system, such as a digital camera. A controller is connected to the digital camera. The controller receives the digital image data of a device that is generated by the camera. The controller processes the digital image data to generate control commands. A variable grid generation system is also connected to the controller. The variable grid generation system can receive commands from the controller, and can generate a grid in response to the commands that matches the component and that allows the component to be inspected.

3D profile analysis for surface contour inspection

Growing community of inventors

Singapore, Singapore

Wong Soon Wei