Samsung Electronics Co., Ltd.

Sungkyunkwan University

Won-young Kim

Jinchan Ahn

Chanho Lee

Jin-Chan Ahn

Jae-young Choi

Sun-Won Kang

Sanghyun Park

Seung-Hyun Hong

MuSeob Shin

Seung-hyun Baik

Sang-hoon Lee

Do-Hyun Kim

Hyunsoo Chung

Ae-Nee Jang

SunWon Kang

Young-hee Lee

Eun-sung Kim

Sunwon Kang

Myeong Soon Park

Dae-woo Suh

Kyung-seon Hwang

A semiconductor package includes a substrate, a master chip on the substrate, a first slave chip on a top surface of the master chip and partially exposing the top surface of the master chip, the first slave chip having a same size as the master chip and having a same storage capacity as the master chip, and a first chip connector on the exposed top surface of the master chip and coupled to the master chip and the first slave chip.

Semiconductor package having chip stack

Disclosed is a semiconductor package including a semiconductor chip that includes a chip pad on one surface of the semiconductor chip, a redistribution pattern on the one surface of the semiconductor chip and electrically connected to the chip pad, and a photosensitive dielectric layer between the semiconductor chip and the redistribution pattern. The photosensitive dielectric layer may be in physical contact with the redistribution pattern. The redistribution pattern includes a signal redistribution pattern, a ground redistribution pattern, and a power redistribution pattern. A vertical distance between the chip pad and the signal redistribution pattern may be greater than a width of the signal redistribution pattern.

Semiconductor package

Provided are a semiconductor device and a method of manufacturing the same. The semiconductor device includes a metal line layer on a semiconductor substrate, and a metal terminal on the metal line layer. The metal line layer includes metal lines, and a passivation layer having a non-planarized top surface including flat surfaces on the metal lines and a concave surface between the metal lines. The metal terminal is provided on the passivation layer. Opposite lateral surfaces of the metal terminal facing each other are provided on the flat surfaces of the passivation layer.

Semiconductor device having metal bump and method of manufacturing the same

A semiconductor package includes a first interconnect substrate on a first redistribution substrate and having a first opening penetrating the first interconnect substrate. A first semiconductor chip is on the first redistribution substrate and the first opening of the first interconnect substrate. A second redistribution substrate is on the first interconnect substrate and the first semiconductor chip. A second interconnect substrate is on the second redistribution substrate and has a second opening penetrating the second interconnect substrate. A second semiconductor chip is on the second redistribution substrate and in the second opening of the second interconnect substrate.

Semiconductor package having a plurality of chips and method of manufacturing the same

Provided are a semiconductor device and a semiconductor package including the same. The semiconductor device comprises a semiconductor chip body including a first chip pad on a top surface, a passivation film disposed on the semiconductor chip body and a first redistribution layer that is disposed between the passivation film and the semiconductor chip body with an opening to expose a first chip center pad region at least partially overlapping the first chip pad, a first redistribution center pad region connected to the first chip center pad region, and a first edge pad region spaced apart from the first redistribution center pad region, through the passivation film, wherein a top surface of the first chip center pad region and a top surface of the first redistribution center pad region are not disposed on the same plane.

Semiconductor device and semiconductor package including the same

A method of manufacturing a semiconductor package includes obtaining a plurality of individual chips classified according to a test bin item as a result of performing an electrical die sorting (EDS) process including testing electrical characteristics of a plurality of chips at a wafer level, packaging the individual chips on corresponding chip mounting regions of a circuit substrate and forming a plurality of individual packages based on position information of the chip mounting regions, each of the individual packages having test bin item information corresponding to the test bin item, classifying the plurality of individual packages according to the test bin item based on the test bin item information, and testing the individual packages classified according to the test bin item.

Method of manufacturing semiconductor package

A circuit board and a semiconductor packages therewith are disclosed. The circuit board may include a top surface, on which at least one semiconductor chip is mounted, and a bottom surface, to which at least one outer terminal is coupled. The top surface may include an upper window region, on which an upper conductive pattern electrically connected to the semiconductor chip is provided, and the bottom surface may include a lower window region, on which a lower conductive pattern electrically connected to the upper conductive pattern is provided. Here, a ratio of an area of the lower conductive pattern to an area of the upper conductive pattern may be less than or equal to 1.5.

Circuit boards and semiconductor packages including the same

A thermoelectric material includes a stack structure including alternately stacked first and second material layers. The first material layer may include a carbon nano-material. The second material layer may include a thermoelectric inorganic material. The first material layer may include a thermoelectric inorganic material in addition to the carbon nano-material. The carbon nano-material may include, for example, graphene. At least one of the first and second material layers may include a plurality of nanoparticles. The thermoelectric material may further include at least one conductor extending in an out-of-plane direction of the stack structure.

Thermoelectric material and thermoelectric device including the same

Semiconductor devices with redistribution pads are disclosed. The semiconductor device includes a plurality of electric pads provided on a semiconductor substrate, and a plurality of redistribution pads electrically connected to the electric pads and an outer terminal. The plurality of redistribution pads includes a plurality of first redistribution pads constituting a transmission path for a first electrical signal and at least one second redistribution pad constituting a transmission path for a second electrical signal different from the first electrical signal. The first redistribution pads are arranged on the semiconductor substrate to form at least two rows, and the at least one second redistribution pad is disposed between the at least two rows of the first redistribution pads.

Semiconductor devices with redistribution pads

Provided is a printed circuit board including a first conductive layer including a first conductive layer including a recessed portion, a protruding portion disposed at a higher level than that of the recessed portion, and a connecting portion connecting the recessed portion with the protruding portion. A second conductive layer is disposed above the recessed portion of the first conductive layer. A core layer is disposed between the first conductive layer and the second conductive layer. An upper solder resist layer is disposed on the second conductive layer. The upper solder resist layer exposes at least a portion of the protruding portion. A lower solder resist layer is disposed below the first conductive layer.

Growing community of inventors

Seoul, South Korea

Won-young Kim