Samsung Display Co., Ltd.

Won-Gu Cho

Kang-Won Lee

Young-Sik Kim

Ju-Young Yoon

Seong-Yong Hwang

Choon-Hyop Lee

Hyun-Jae Lee

Weon-Sik Oh

Jin-Suk Lee

Hee-Woong Park

Jeong-Heon Lee

Ye-Bin Lee

Cheol-Yong Jeong

Sung-Chul Kang

A display device includes a first substrate, a flexible printed circuit, and a film. The flexible printed circuit is disposed on a first area of the first substrate. The film is disposed on the first substrate and the flexible printed circuit. The flexible printed circuit includes a second substrate, a pad area, and a dummy pad. The pad area comprises pads disposed on the second substrate. The pads extend in a first direction and are spaced apart from one another in a second direction crossing the first direction. The dummy pad is disposed on the second substrate. The dummy pad is spaced apart from the pad area.

Flexible printed circuit and display device

A display device including a first film, a flexible printed circuit, and a second film. The first film includes a substrate and a non-adhesive pattern, where the substrate includes a first area and a second area adjacent to the first area, and the non-adhesive pattern is formed on at least a portion of the second area. The flexible printed circuit is disposed on the first area of the first film. The second film is disposed on the flexible printed circuit and the first film.

Touch sensing unit and display device

A substrate of an electronic device may include a first test region and a second test region to measure resistance at a connection portion. The first test region and the second test region each includes a plurality of measuring pad portions, a protective layer disposed on the plurality of measuring pad portions, and a contact assistance member disposed on the protective layer. The protective layer in the first test region includes a first contact hole exposing the plurality of measuring pad portions. The contact assistance member in the first test region contacts the measuring pad portion exposed through the first contact hole. The protective layer in the second test region includes two second contact holes exposing one measuring pad portion, and the contact assistance member in the second test region contacts the one measuring pad portion through the two second contact holes.

Substrate of electronic device, electronic device including the same, and measuring method of resistance at connection portion

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Cheonan-si, South Korea

Won-Gu Cho